User Guide

CC Technical Documentation Troubleshooting - RF (Part 1)
RM-11
Issue 1 02/2004 ©2004 Nokia Corporation Confidential Page 25
RF MS RX FER CELL CH384 At this stage, FER is most likely caused by a poor RF connection.
Perform a conductive RSSI measurement with sector power at -
65dBm (low LNA gain) and -100dBm (high LNA gain).
RF MS SINAD SINAD is measurement of a phone’s audio quality in an AMPS call.
Hence, a secured audio plug is needed to be checked for any con-
nection problem. Verify this on the bench in an AMPS call.
RF GPS Test Mode 3 Inject signal and test SNR with the GPS self-test. If SNR is out-of-
limits, then probe chain.
RF MS TX Limiting Po PCS CH25 Tx limiting power is most likely caused by a poor RF connection.
RF MS TX Limiting Po CELL CH1013 Tx limiting power is most likely caused by a poor RF connection.
Test Failed What to Check