User Guide

CCS Technical Documentation Troubleshooting — RF
RH-17
Issue 1 04/2003 Nokia Corporation Confidential Page 25
cuit is used to form the voltage into the proper range.
Explanation of Result
The offset is a result of scaled value and global value determined in Test 26 and used to
calculate VBAT Offset.
Manual Verification
In Phoenix, set phone to local mode then EM Calibration. Press read from phone.
Troubleshooting
Check Battery Connector X101, baseband components D200, D400, and D450 are sol-
dered and aligned correctly. Remember that this gain factor is determined using Test 26
as a reference. Make sure it was within limits too.
Test 31 BB Cal VCHAR Gain
Description:
This baseband calibration teaches the ADC what two different voltage inputs look like.
Lower known voltage input is 3.0 Vdc and higher input is 8.4 Vdc.
Explanation of Result:
The gain factor is a result of the two voltages and the global value determined in Test 25
and used to calculate VCHAR Gain.
Manual Verification:
In Phoenix set phone to local mode then EM Calibration. Press read from phone.
Troubleshooting:
For production the VCHAR voltage is sent to galvanic pads on the PWB. Check for solder
bridge on X104, fuse F100, L100, C106 and V100. Remember that this gain factor is
determined using Test 25 as a reference, make sure it was within limits also.
Test 32 BB Cal VCHAR Offset
Description
This baseband calibration teaches the ADC what two different voltage inputs look like.
Lower known voltage input is 3.0 Vdc and higher input is 8.4 Vdc.
Explanation of Result:
The offset is a result of the two current limit values and the global value determined in
Test 26 and used to calculate VCHAR offset.
Manual Verification:
In Phoenix set phone to local mode then EM Calibration. Press read from phone.