User's Manual

TX Pilot Time Offset Acceptance Test
4-18 1X SC 4812T Lite BTS Optimization/ATP FEB 2005
PRELIMINARY
Background
Overview
This test verifies the transmitted Pilot Channel Element Pilot Time
Offset of each operator–selected BBX Carrier keyed–up at a specific
frequency specified in the current CDF. All tests will be performed using
the external, calibrated Test Equipment controlled by the same
command. All measurements will be made at the BTS TX Antenna
Connector..
Equipment Operation During Testing
The Pilot Gain will be set to 262 for each antenna and all TCH
Elements from the MCC Cards will be forward–link disabled. The
selected BBX Cards will be keyed using both bbxlvl and BLO to
generate a CDMA Carrier (with Pilot Channel Element only, Walsh
Code 0). TX Power Output is set at 40 dBm as measured at the TX
Output..
Test Measurements
The Test Equipment will measure and return the Pilot Time Offset in ms,
verifying that results meet the following specification.:
Pilot Time Offset should be within 3 ms of the target PT Offset
(zeroms).
.Redundant BBX Testing –
The BBX will then de–key, and if selected, the Redundant BBX will be
assigned to the current TX Antenna Path under test. The test will then be
repeated for the Redundant BBX..
This test also executes and returns the TX Frequency and
TX Waveform Quality (Rho) ATP Tests, however, only
Pilot Time Offset results are written to the ATP Test
Report.
NOTE
Pilot Time Offset Acceptance
Test
Perform the procedure in Table 4-7 to verify that the Pilot Time Offset
on the TX Antenna Paths for the selected BBX Cards.
Table 4-7: Test Pilot Time Offset
n Step Action
1 Set–up the Test Equipment for TX Acceptance Tests per Table 4-1.
2 Select the BBX Cards to be tested.
table continued on next page
4