User's Manual

FRU Optimization/ATP Test Matrix – continued
PRELIMINARY
1X SCt4812ET Lite BTS Optimization/ATP
08/01/2001
B-2
Detailed Optimization/ATP Test
Matrix
Table B-3 outlines in more detail the tests that would need to be
performed if one of the BTS components were to fail and be replaced. It
is also assumed that all modules are placed OOS–ROM via the LMF
until full redundancy of all applicable modules is implemented.
The following guidelines should also be noted when using this table.
Not every procedure required to bring the site back on line
is indicated in Table B-3. It is meant to be used as a
guideline ONLY. The table assumes that the user is familiar
enough with the BTS Optimization/ATP procedure to
understand which test equipment set ups, calibrations, and
BTS site preparation will be required before performing the
Table # procedures referenced.
IMPORTANT
*
Various passive BTS components (such as the TX and RX directional
couplers, Preselector IO, CIO; etc.) only call for a TX or RX calibration
audit to be performed in lieu of a full path calibration. If the RX or TX
path calibration audit fails, the entire RF path calibration will need to be
repeated. If the RF path calibration fails, further troubleshooting is
warranted.
Whenever any SCCP BACKPLANE is replaced, it is assumed that only
power to the SCCP shelf being replaced is turned off via the breaker
supplying that shelf.
If any significant change in signal level results from any
component being replaced in the RX or TX signal flow
paths, it would be identified by re–running the RX and TX
calibration audit command.
NOTE
When the CIO is replaced, the SCCP shelf remains powered up. The
BBX2 boards may need to be removed, then re–installed into their
original slots, and re–downloaded (code and BLO data). RX and TX
calibration audits should then be performed.
B