User's Manual

Individual ATP Test Background Information
68P09258A31–A
Oct 2003
1X SCt 4812T BTS Optimization/ATP
4-12
Figure 4-1: TX Mask Verification Spectrum Analyzer Display
– 900 kHz
+ 900 kHz
Center Frequency
Reference
Attenuation level of all
spurious and IM products
with respect to the mean
power of the CDMA channel
.5 MHz Span/Div
Ampl 10 dB/Div
Mean CDMA Bandwidth
Power Reference
+750 kHz
+ 1980 kHz
– 750 kHz
– 1980 kHz
FW00282
TX Waveform Quality (rho) Acceptance Test
This test verifies the transmitted Pilot channel element digital waveform
quality of each BBX carrier keyed up at a specific frequency per the
current CDF file assignment. All tests are performed using the external
calibrated test set controlled by the same command. All measurements
are via the appropriate TX OUT (BTS/RFDS) connector.
The Pilot Gain is set to 262 for each antenna, and all channel elements
from the MCCs are forward link disabled. The BBX is keyed up, using
both bbxlvl and bay level offsets, to generate a CDMA carrier (with pilot
channel element only, Walsh code 0). BBX power output is set to
40 dBm as measured at the TX OUT connector (on either the BTS or
RFDS directional coupler).
The calibrated communications test set measures and returns the Pilot
channel element digital waveform quality (rho) in dB, verifying that the
result meets system tolerances:
S Waveform quality (rho) should be w0.912 (–0.4dB).
The BBX then de-keys and, if selected, the MCC is re-configured to
assign the applicable redundant BBX to the current TX antenna path
under test. The test is then repeated.
See Table 4-1 to perform this test.
4