User's Manual

Index
68P64115A18–1
1X SC 4812T Lite BTS Optimization/ATP Software Release R2.16.1.x
DRAFT
Mar 2003
Index-2
Numbers
10 MHz Rubidium Standard, optional test equipment,
1-12
10BaseT/10Base2 Converter, 1-8
10BaseT/10Base2 converter
LMF to BTS connection, 3-17
remove from BTS, 5-5
2:1 combiners, description, 1-22
2–way splitter, optional test equipment, 1-11
A
Abbreviated
RX acceptance test, all–inclusive, 4-9
TX acceptance test, all–inclusive, 4-9
Acceptance Test Procedure. See ATP
ACTIVE LED
GLI, 6-31
MCC, 6-33
Advantest R3267 Spectrum Analyzer GPIB Address,
F-5
Advantest R3465 Communications Test Set GPIB
Address, F-9
Advantest R3562 Signal Generator GPIB Address,
F-6
Agilent 8935 Series E6380 (formerly HP 8935) Test
Set GPIB Address, F-7
Agilent E4406A, calibration, F-25
Agilent E4406A Transmitter Tester GPIB Address,
F-3
Agilent E4432B Signal Generator GPIB Address, F-4
ALARM LED, GLI, 6-31
Alarm Monitor window, 3-109
Alarm Reporting Display, 3-109
All Cal/Audit procedure, 3-92
All RX ATP Test Procedure, 4-12
All tests fail on a single antenna, Troubleshooting,
RFDS, 6-27
All TX ATP Test Procedure, 4-12
All TX/RX ATP Test Procedure, 4-10
Applying AC Power, 2-11
ATP
all inclusive TX acceptance test outline, 4-9
automated introduction, 4-2
code domain noise floor acceptance test procedure,
4-25
code domain power acceptance test procedure, 4-25
failure report generation, 4-29
FER test, frame error rate testing, 4-28
pilot time offset, 4-23
prerequisites, 4-3
spectral purity TX mask, 4-18
test matrix/detailed optimization, C-2
test set–up, 3-66
Advantest R3267/R3562
DRDCs, 3-69
TRDCs, 3-71
Advantest R3465, 3-66
Agilent 8935, DRDCs, 3-66
Agilent 8935/E4432B, DRDCs, 3-68, 3-70
Agilent E4406A/E4432B
DRDCs, 3-68
TRDCs, 3-70
CyberTest, 3-66
HP 8921A, 1.9 GHz, 3-67
HP 8921A, 800 MHz, 3-67
waveform quality (Rho), 4-21
waveform quality (RHO) acceptance test procedure,
4-21
ATP – Reduced, 4-2
Attenuator, required test equipment, 1-10
B
Basic Troubleshooting Overview, 6-2
Battery Charge Test (Connected Batteries), 2-13
Battery Discharge Test, 2-14
Bay Level Offset calibration
description, 3-83
purpose, 3-83
when to calibrate, 3-84
Bay Level offset calibration failure, 6-10
BBX
carrier spectral purity, 4-17
gain set point vs SIF output considerations, D-2
primary and redundant, TX tests to be performed,
4-15
BBX LED status combinations, 6-33
BBX2 Connector, 6-20
BLO. See Bay Level Offset calibration
Bringing modules into service, prepare to leave the
site, 5-5