User's Manual
Index
68P09255A69-3
1X SC4812ET Lite BTS Optimization/ATP Software Release 2.16.1.x
PRELIMINARY
Aug 2002
Index-2
Numbers
10 MHz Rubidium Standard, optional test equipment,
1-11
10BaseT/10Base2 converter
LMF to BTS connection, 3-22
remove from BTS, 5-4
2:1 combiners, description, 1-20
2:1 TX combiner location, 1-30
2-way splitter, optional test equipment, 1-11
20-pair punchblock
description, 1-20
location, 1-20
punchdowns, 3-20
50-pair punchblock
description, 1-21
location, 1-21, 3-17
RGPS punchdowns
non-expansion frame, 3-19
primary expansion frame, 3-20
secondary expansion frame, 3-19
A
Abbreviated
RX acceptance test, all-inclusive, 4-8
TX acceptance test, all-inclusive, 4-8
Acceptance Test Procedure. See ATP
ACTIVE LED
GLI, 6-30
MCC, 6-32
Advantest R3465, setting GPIB address, F-8
Agilent E4406A, calibration, F-24
Alarm and Span Line Cable Pin/Signal Information,
3-17
ALARM LED, GLI, 6-30
Alarm Monitor window, 3-103
Alarm Reporting Display, 3-103
All Cal/Audit procedure, 3-86
All RX ATP Test Procedure, 4-11
All tests fail on a single antenna, Troubleshooting,
RFDS, 6-26
All TX ATP Test Procedure, 4-10
All TX/RX ATP Test Procedure, 4-9
Applying AC Power, 2-12
ATP
all inclusive TX acceptance test outline, 4-8
automated introduction, 4-1
code domain noise floor acceptance test procedure,
4-23
code domain power acceptance test procedure, 4-23
failure report generation, 4-27
FER test, frame error rate testing, 4-25
pilot time offset, 4-20
prerequisites, 4-2
spectral purity TX mask, 4-16
test matrix/detailed optimization, B-1
test set-up, 3-61
Advantest R3267/R3562
DRDCs, 3-64
TRDCs, 3-66
Advantest R3465, 3-61
Agilent 8935, DRDCs, 3-61
Agilent 8935/E4432B, DRDCs, 3-63, 3-65
Agilent E4406A/E4432B
DRDCs, 3-63
TRDCs, 3-65
CyberTest, 3-61
HP 8921A, 1.9 GHz, 3-62
HP 8921A, 800 MHz, 3-62
waveform quality (Rho), 4-18
waveform quality (RHO) acceptance test procedure,
4-18
ATP - Reduced, 4-1
Attenuator, required test equipment, 1-9
B
Basic Troubleshooting Overview, 6-1
Battery Charge Test (Connected Batteries), 2-15
Battery Discharge Test, 2-16
Bay Level Offset calibration
description, 3-78
purpose, 3-78
when to calibrate, 3-79
Bay Level offset calibration failure, 6-9
BBX
carrier spectral purity, 4-15
gain set point vs SIF output considerations, C-1
primary and redundant, TX tests to be performed,
4-13
BBX LED status combinations, 6-32
BBX2 Connector, 6-19
BLO. See Bay Level Offset calibration
Bringing modules into service, prepare to leave the
site, 5-4