Data Sheet
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Nexperia B.V. 2017. All rights reserved
HEF4013B All information provided in this document is subject to legal disclaimers.
Product data sheet Rev. 9 — 10 December 2015 9 of 16
Nexperia
HEF4013B
Dual D-type flip-flop
Test and measurement data is given in Table 10;
Definitions test circuit:
DUT = Device Under Test.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= Load capacitance including jig and probe capacitance.
Fig 6. Test circuit for measuring switching times
9
''
9
,
9
2
DDJ
'87
&
/
5
7
*
Table 10. Test data
Supply voltage Input Load
V
DD
V
I
t
r
, t
f
C
L
5 V to 15 V V
SS
or V
DD
20 ns 50 pF