DAQ 6023E/6024E/6025E Multifunction I/O Devices User Manual
Table Of Contents
- 6023E/6024E/6025E User Manual
- Support
- Important Information
- Contents
- About This Manual
- Chapter 1 Introduction
- Chapter 2 Installation and Configuration
- Chapter 3 Hardware Overview
- Chapter 4 Signal Connections
- I/O Connector
- Analog Input Signal Overview
- Analog Input Signal Connections
- Analog Output Signal Connections
- Digital I/O Signal Connections
- Programmable Peripheral Interface (PPI)
- Power Connections
- Timing Connections
- Field Wiring Considerations
- Chapter 5 Calibration
- Appendix A Specifications
- Appendix B Custom Cabling and Optional Connectors
- Appendix C Common Questions
- Appendix D Technical Support Resources
- Glossary
- Index
- Figures
- Figure 1-1. The Relationship Between the Programming Environment, NI-DAQ, and Your Hardware
- Figure 3-1. PCI-6023E, PCI-6024E, PCI-6025E, and PXI-6025E Block Diagram
- Figure 3-2. DAQCard-6024E Block Diagram
- Figure 3-3. Dithering
- Figure 3-4. CONVERT* Signal Routing
- Figure 3-5. PCI RTSI Bus Signal Connection
- Figure 3-6. PXI RTSI Bus Signal Connection
- Figure 4-1. I/O Connector Pin Assignment for the 6023E/6024E
- Figure 4-2. I/O Connector Pin Assignment for the 6025E
- Figure 4-3. Programmable Gain Instrumentation Amplifier (PGIA)
- Figure 4-4. Summary of Analog Input Connections
- Figure 4-5. Differential Input Connections for Ground Referenced Signals
- Figure 4-6. Differential Input Connections for Nonreferenced Signals
- Figure 4-7. Single Ended Input Connections for Nonreferenced or Floating Signals
- Figure 4-8. Single Ended Input Connections for Ground Referenced Signals
- Figure 4-9. Analog Output Connections
- Figure 4-10. Digital I/O Connections
- Figure 4-11. Digital I/O Connections Block Diagram
- Figure 4-12. DIO Channel Configured for High DIO Power-up State with External Load
- Figure 4-13. Timing Specifications for Mode 1 Input Transfer
- Figure 4-14. Timing Specifications for Mode 1 Output Transfer
- Figure 4-15. Timing Specifications for Mode 2 Bidirectional Transfer
- Figure 4-16. Timing I/O Connections
- Figure 4-17. Typical Posttriggered Acquisition
- Figure 4-18. Typical Pretriggered Acquisition
- Figure 4-19. SCANCLK Signal Timing
- Figure 4-20. EXTSTROBE* Signal Timing
- Figure 4-21. TRIG1 Input Signal Timing
- Figure 4-22. TRIG1 Output Signal Timing
- Figure 4-23. TRIG2 Input Signal Timing
- Figure 4-24. TRIG2 Output Signal Timing
- Figure 4-25. STARTSCAN Input Signal Timing
- Figure 4-26. STARTSCAN Output Signal Timing
- Figure 4-27. CONVERT* Input Signal Timing
- Figure 4-28. CONVERT* Output Signal Timing
- Figure 4-29. SISOURCE Signal Timing
- Figure 4-30. WFTRIG Input Signal Timing
- Figure 4-31. WFTRIG Output Signal Timing
- Figure 4-32. UPDATE* Input Signal Timing
- Figure 4-33. UPDATE* Output Signal Timing
- Figure 4-34. UISOURCE Signal Timing
- Figure 4-35. GPCTR0_SOURCE Signal Timing
- Figure 4-36. GPCTR0_GATE Signal Timing in Edge Detection Mode
- Figure 4-37. GPCTR0_OUT Signal Timing
- Figure 4-38. GPCTR1_SOURCE Signal Timing
- Figure 4-39. GPCTR1_GATE Signal Timing in Edge Detection Mode
- Figure 4-40. GPCTR1_OUT Signal Timing
- Figure 4-41. GPCTR Timing Summary
- Figure B-1. 68 Pin E Series Connector Pin Assignments
- Figure B-2. 68 Pin Extended Digital Input Connector Pin Assignments
- Figure B-3. 50 Pin E Series Connector Pin Assignments
- Figure B-4. 50-Pin Extended Digital Input Connector Pin Assignments
- Tables
- Table 3-1. Available Input Configurations
- Table 3-2. Measurement Precision
- Table 3-3. Pins Used by PXI E Series Device
- Table 4-1. I/O Connector Details
- Table 4-2. I/O Connector Signal Descriptions
- Table 4-3. I/O Signal Summary
- Table 4-4. Port C Signal Assignments
- Table 4-5. Signal Names Used in Timing Diagrams

Chapter 5 Calibration
6023E/6024E/6025E User Manual 5-2 ni.com
This method of calibration is not very accurate because it does not take into
account the fact that the device measurement and output voltage errors can
vary with time and temperature. It is better to self-calibrate the device when
it is installed in the environment in which it will be used.
Self-Calibration
Your device can measure and correct for almost all of its calibration-related
errors without any external signal connections. Your National Instruments
software provides a self-calibration method. This self-calibration process,
which generally takes less than a minute, is the preferred method of
assuring accuracy in your application. Initiate self-calibration to minimize
the effects of any offset, gain, and linearity drifts, particularly those due to
warmup.
Immediately after self-calibration, the only significant residual calibration
error could be gain error due to time or temperature drift of the onboard
voltage reference. This error is addressed by external calibration, which is
discussed in the following section. If you are interested primarily in relative
measurements, you can ignore a small amount of gain error, and
self-calibration should be sufficient.
External Calibration
Your device has an onboard calibration reference to ensure the accuracy of
self-calibration. Its specifications are listed in Appendix A, Specifications.
The reference voltage is measured at the factory and stored in the EEPROM
for subsequent self-calibrations. This voltage is stable enough for most
applications, but if you are using your device at an extreme temperature or
if the onboard reference has not been measured for a year or more, you may
wish to externally calibrate your device.
An external calibration refers to calibrating your device with a known
external reference rather than relying on the onboard reference.
Redetermining the value of the onboard reference is part of this process and
you can save the results in the EEPROM, so you should not have to perform
an external calibration very often. You can externally calibrate your device
by calling the NI-DAQ calibration function.
To externally calibrate your device, be sure to use a very accurate external
reference. Use a reference that is several times more accurate than the
device itself.