DAQ 6023E/6024E/6025E Multifunction I/O Devices User Manual
Table Of Contents
- 6023E/6024E/6025E User Manual
- Support
- Important Information
- Contents
- About This Manual
- Chapter 1 Introduction
- Chapter 2 Installation and Configuration
- Chapter 3 Hardware Overview
- Chapter 4 Signal Connections
- I/O Connector
- Analog Input Signal Overview
- Analog Input Signal Connections
- Analog Output Signal Connections
- Digital I/O Signal Connections
- Programmable Peripheral Interface (PPI)
- Power Connections
- Timing Connections
- Field Wiring Considerations
- Chapter 5 Calibration
- Appendix A Specifications
- Appendix B Custom Cabling and Optional Connectors
- Appendix C Common Questions
- Appendix D Technical Support Resources
- Glossary
- Index
- Figures
- Figure 1-1. The Relationship Between the Programming Environment, NI-DAQ, and Your Hardware
- Figure 3-1. PCI-6023E, PCI-6024E, PCI-6025E, and PXI-6025E Block Diagram
- Figure 3-2. DAQCard-6024E Block Diagram
- Figure 3-3. Dithering
- Figure 3-4. CONVERT* Signal Routing
- Figure 3-5. PCI RTSI Bus Signal Connection
- Figure 3-6. PXI RTSI Bus Signal Connection
- Figure 4-1. I/O Connector Pin Assignment for the 6023E/6024E
- Figure 4-2. I/O Connector Pin Assignment for the 6025E
- Figure 4-3. Programmable Gain Instrumentation Amplifier (PGIA)
- Figure 4-4. Summary of Analog Input Connections
- Figure 4-5. Differential Input Connections for Ground Referenced Signals
- Figure 4-6. Differential Input Connections for Nonreferenced Signals
- Figure 4-7. Single Ended Input Connections for Nonreferenced or Floating Signals
- Figure 4-8. Single Ended Input Connections for Ground Referenced Signals
- Figure 4-9. Analog Output Connections
- Figure 4-10. Digital I/O Connections
- Figure 4-11. Digital I/O Connections Block Diagram
- Figure 4-12. DIO Channel Configured for High DIO Power-up State with External Load
- Figure 4-13. Timing Specifications for Mode 1 Input Transfer
- Figure 4-14. Timing Specifications for Mode 1 Output Transfer
- Figure 4-15. Timing Specifications for Mode 2 Bidirectional Transfer
- Figure 4-16. Timing I/O Connections
- Figure 4-17. Typical Posttriggered Acquisition
- Figure 4-18. Typical Pretriggered Acquisition
- Figure 4-19. SCANCLK Signal Timing
- Figure 4-20. EXTSTROBE* Signal Timing
- Figure 4-21. TRIG1 Input Signal Timing
- Figure 4-22. TRIG1 Output Signal Timing
- Figure 4-23. TRIG2 Input Signal Timing
- Figure 4-24. TRIG2 Output Signal Timing
- Figure 4-25. STARTSCAN Input Signal Timing
- Figure 4-26. STARTSCAN Output Signal Timing
- Figure 4-27. CONVERT* Input Signal Timing
- Figure 4-28. CONVERT* Output Signal Timing
- Figure 4-29. SISOURCE Signal Timing
- Figure 4-30. WFTRIG Input Signal Timing
- Figure 4-31. WFTRIG Output Signal Timing
- Figure 4-32. UPDATE* Input Signal Timing
- Figure 4-33. UPDATE* Output Signal Timing
- Figure 4-34. UISOURCE Signal Timing
- Figure 4-35. GPCTR0_SOURCE Signal Timing
- Figure 4-36. GPCTR0_GATE Signal Timing in Edge Detection Mode
- Figure 4-37. GPCTR0_OUT Signal Timing
- Figure 4-38. GPCTR1_SOURCE Signal Timing
- Figure 4-39. GPCTR1_GATE Signal Timing in Edge Detection Mode
- Figure 4-40. GPCTR1_OUT Signal Timing
- Figure 4-41. GPCTR Timing Summary
- Figure B-1. 68 Pin E Series Connector Pin Assignments
- Figure B-2. 68 Pin Extended Digital Input Connector Pin Assignments
- Figure B-3. 50 Pin E Series Connector Pin Assignments
- Figure B-4. 50-Pin Extended Digital Input Connector Pin Assignments
- Tables
- Table 3-1. Available Input Configurations
- Table 3-2. Measurement Precision
- Table 3-3. Pins Used by PXI E Series Device
- Table 4-1. I/O Connector Details
- Table 4-2. I/O Connector Signal Descriptions
- Table 4-3. I/O Signal Summary
- Table 4-4. Port C Signal Assignments
- Table 4-5. Signal Names Used in Timing Diagrams
Chapter 3 Hardware Overview
6023E/6024E/6025E User Manual 3-6 ni.com
The approximately 4 V step from 4 V to 1 mV is 4,000% of the new
full-scale range. It can take as long as 100 µs for the circuitry to settle to
1 LSB after such a large transition. In general, this extra settling time is not
needed when the PGIA is switching to a lower gain.
Settling times can also increase when scanning high-impedance signals
due to a phenomenon called charge injection, where the analog input
multiplexer injects a small amount of charge into each signal source when
that source is selected. If the impedance of the source is not low enough,
the effect of the charge—a voltage error—has not decayed by the time the
ADC samples the signal. For this reason, keep source impedances under
1kΩ to perform high-speed scanning.
Due to the previously described limitations of settling times resulting from
these conditions, multiple-channel scanning is not recommended unless
sampling rates are low enough or it is necessary to sample several signals
as nearly simultaneously as possible. The data is much more accurate and
channel-to-channel independent if you acquire data from each channel
independently (for example, 100 points from channel 0, then 100 points
from channel 1, then 100 points from channel 2, and so on).
Analog Output
♦ 6025E and 6024E only
These devices supply two channels of analog output voltage at the I/O
connector. The bipolar range is fixed at ±10 V. Data written to the
digital-to-analog converter (DAC) is interpreted in two’s complement
format.
Analog Output Glitch
In normal operation, a DAC output glitches whenever it is updated with a
new value. The glitch energy differs from code to code and appears as
distortion in the frequency spectrum.