Datasheet

LXDC2HL series
Micro DC-DC converter
7
Dec 2014
6-3 Thermal and Current De-rating Information
The following figures show the power dissipation and temperature rise characteristics. These data are
measured on Murata’s evaluation board of this device at no air-flow condition.
The output current of the device may need to be de-rated if it is operated in a high ambient temperature or in a
continuous power delivering application. The amount of current de-rating is highly dependent on the
environmental thermal conditions, i.e. PCB design, nearby components or effective air flows. Care should
especially be taken in applications where the device temperature exceeds 85
o
C.
The IC temperature of the device must be kept lower than the maximum rating of 125
o
C. It is generally
recommended to take an appropriate de-rating to IC temperature for a reliable operation. A general de-rating for
the temperature of semiconductor is 80%.
MLCC capacitor’s reliability and the lifetime is also dependant on temperature and applied voltage stress.
Higher temperature and/or higher voltage cause shorter lifetime of MLCC, and the degradation can be
described by the Arrhenius model. The most critical parameter of the degradation is IR (Insulation Resistance).
The below figure shows MLCC’s B1 life based on a failure rate reaching 1%. It should be noted that wear-out
mechanisms in MLCC capacitor is not reversible but cumulative over time.
0
50
100
150
200
250
300
350
400
0 100 200 300 400 500 600
Power Dissipation (mW)
Io (mA)
Io - Loss Characteristics (Vin=3.6V, Vo=1.8V)
0
5
10
15
20
25
30
35
40
45
50
0 100 200 300 400
ΔT (
o
C）
Power Dissipation (mW)
Loss - ΔT Characteristics (Vin=3.6V, Vo=1.8V)