User`s manual

Lake Shore MTD Series Cryotest System User’s Manual
Introduction 1-1
CHAPTER 1
INTRODUCTION
1.0 GENERAL
This chapter provides an introduction to the Modular Test Dewar (MTD) Cryotest System. The MTD
System was designed and manufactured in the United States of America by Lake Shore Cryotronics,
Inc. The MTD Series consists primarily of the Model MTD-150, a Single-Position Continuous Flow
Cryostat System. Other configurations can be made from the basic MTD-150 unit. By design, the MTD
Cryotest System is versatile and easily configured per individual Customer requirement. Some of the
other optional accessories that can be incorporated include multiple positions, single- and dual-focal
plane arrays, a pour-fill dewar, internal radiation sources, various fanout and personality boards,
breakout modules and boxes, etc. Details on options and accessories are provided in Chapter 6.
Since it is not practical to cover all the possible configurations, this MTD Cryotest System Manual will
cover the Model MTD-150 in detail. If required, additional details specific to a Customer configuration
will be included in the Appendices.
The MTD Cryotest System uses the Lake Shore Series DT-470 Silicon Diode Temperature Sensor.
Interchangeable, repeatable, accurate, wide range customized for cryogenics. Sensor installation is
covered in detail in the Lake Shore Product Catalog, Application Notes, and Technical Data (as listed on
the next page under List of Associated Lake Shore Publications).
User information is presented in the following chapters. Chapter 1 provides an introduction to the entire
system. Also included in Chapter 1 is a list of Model MTD-150 Specifications. Connection pin definitions
are also provided in Chapter 1. Chapter 2 provides unpacking, inspection, and return information.
Chapter 3 is used for system installation. System operation is described in Chapter 4. Troubleshooting is
provided in Chapter 5. Finally, Options and accessories are covered in Chapter 6.
Several appendices have been included to enhance the usability of the manual. Appendix A is a
glossary of terminology. Appendix B is a list of units for magnetic properties. Temperature Scales are
discussed in Appendix C. A table of elements is provided in Appendix D. Handling of liquid helium and
liquid nitrogen is discussed in Appendix E. The optional pour-fill dewar is detailed in Appendix F. Filter
wheel assemblies for testing of infrared focal plane arrays are detailed in Appendix G. Finally, the Model
MTD-260 with closed-cycle refrigerator is described in Appendix H.
1.1 MTD CRYOTEST SYSTEM GENERAL DESCRIPTION
The Model MTD-150 is a flexible tool which provides high signal quality and optical performance,
precise temperature control, rapid test cycling, and an expandable design. The MTD-150
accommodates virtually all present and future requirements for developmental and production testing of
infrared focal plane arrays and integrated circuits. The unique design of the MTD optimizes test integrity
by greatly minimizing the potential for vacuum leaks and signal interference while, at the same time,
providing users with fast, easy access to a test chamber capable of supporting essentially any kind of
device package. System features include the following:
• A versatile, modular, and easy access test chamber
• Superior electrical characteristics
• High signal quality
• Fast Device Under Test (DUT) turnaround due to rapid temperature cycling capability
• Interchangeable fanout boards
• Precise monitoring and control over a wide temperature range
• High optical performance