Technical data

EIDE - EIDE Tests
http://www.motorola.com/computer/literature 3-31
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3. Number of Sectors to Test.
The “Number of Sectors to Test” field specifies the number of device
sectors to be tested. For example, if two (2) sectors are specified and the
test sector number field is specified as zero (0), then sectors 0 and 1 are
tested.
4. Fill Data.
The “Fill Data” field is used as a seed data value for tests that write to the
disk. Depending upon the “Test Data Increment/Decrement Step” field,
“Fill Data” may remain constant, be incremented, or be decremented after
each 16-bit word write operation.
5. Test Data Increment/Decrement Step.
The “Test Data Increment/Decrement Step” parameter increments or
decrements the data pattern using a user-assigned value. This value is
added to the current data pattern after each 16-bit write operation. The
initial data pattern is defined by the “Fill Data” parameter and, if set to
zero, allows writing a fixed data pattern.
6. Enable Destructive Tests [Y/N]?
If “N” is specified, destructive data tests are disabled. If “Y” is specified,
destructive data tests are enabled. It is important to use a “scratch” EIDE
device since destructive read/write tests are used as part of the EIDE or
“EIDE R/W” test commands.