Technical data

EIDE - EIDE Tests
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EIDE - EIDE Tests
This section describes the EIDE tests. These tests consist of REG, ACC,
and RW.
Entering EIDE without parameters causes all EIDE tests to execute in the
order shown in the table below.
To run an individual test, append the test name to the EIDE command.
Note that the EIDE test needs to be manually configured using the "cf"
command prior to execution.
General Test Description:
The EIDE tests require the attachment of an IDE/EIDE device to the
interface since all tests access registers in the physical device. The device
may be either a hard drive, an ATA-compatible compact flash memory, or
an ATAPI CD-ROM. The use of ATA hard drives is strongly
recommended since results are generally more predictable and test
coverage is more thorough.
ATAPI CD-ROM’s may be tested, but, due to the emerging nature of the
CD interface, testing is less complete. Also, the newer technology of
writeable CD-ROMs is not covered and causes the RW test to be bypassed
when attempted on a CD-ROM.
The tests listed in Table 3-7 are arranged in order of severity to the drive's
configuration and/or data. The REG test is the least intrusive while the RW
test is not only intrusive, but will corrupt data as well.
Data is written to the disk for the number of blocks specified by the
configuration parameters. Since these blocks are overwritten with test
data, use a disk with expendable or no data.
Table 3-7. EIDE Test Group.
Name Description
REG Register Access Test.
ACC Device Address Test.
RW Read/Write Device (Destructive Device Access)