Technical data

IN-1
Index
Numerics
53C8xx SCSI I/O Processor Tests - NCR
3-64
A
ACC1 3-66
ACC2 3-68
ACCESS 3-120
Address and Data Parity Error status 3-9
addressing memory 3-95
ADR 3-95, 3-111
ADR (BBRAM Addressing)
MK48Txx Timekeeping Tests 3-111
AEM 2-2
ALARM 3-113
ALARM interrupt - ALARM 3-113
Alternating Ones/Zeros - ALTS 3-97
ALTS 3-97
Append Error Messages Mode - AEM 2-2
ATA device
use with EIDE tests 3-29
ATTR 3-132
Attribute Register - ATTR 3-132
Audio Codec Tests - CS4231 3-29
AUI connection 3-8
B
Battery Backed-Up RAM - RAM 3-116
BAUD 3-84
BAUD (Baud Rates)
Serial I/O Tests 3-84
Baud Rates - BAUD 3-84
Baud Rates - BAUDS 3-121
BAUDS 3-121
BBRAM addressing - ADR 3-111
BEEP 3-32
BINT
Basic Interrupt Test 3-22
Bit Blitter - BLT 3-133
Bit Toggle - BTOG 3-98
Bit Toggle - ERREN/PERREN/SERREN 3-9
BLT 3-133
BTOG 3-98
C
CEM 2-3
CF 2-3
Chip Initialization - CINIT 3-6
CINIT 3-6
CL1283 - parallel Interface Tests 3-2
Clear (Zero) Error Counters - ZE 2-15
Clear Error Messages - CEM 2-3
CLK 3-114
CLK (Real Time Clock Function)
RTC Timekeeping Tests 3-114
CLOAD 3-7
CLOAD(Continuous Load) 3-7
CNCTR 3-8
connector 3-8
CNT 3-150
CODE 3-100
Code Execution/Copy - CODE 3-100
Codec audio tests 3-29
Color Palette - PAL 3-139
command entry examples 1-3
commands, root-level 2-1