Network Device User Guide

Device User Guide — 9S12C128DGV1/D V01.05
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B.5.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at <2ppm defects over lifetime
at the operating conditions noted.
A program/erase cycle is specified as two transitions of the cell value from erased → programmed →
erased, 1 → 0 → 1.
NOTE: All values shown in Table B-9 are target values and subject to further extensive
characterization.
Table B-9 NVM Reliability Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C Rating Symbol Min Typ Max Unit
1C
Data Retention at an average junction temperature of
T
Javg
= 85°C
t
NVMRET
15 Years
2 C Flash number of Program/Erase cycles
n
FLPE
10,000 Cycles