User`s manual

OPERATING INSTRUCTIONS
M68332BCC/D 3-11 MOTOROLA
REV 1
Memory tests are a series of diagnostics that verify random access memory (read/write)
that may reside on the BCC.
– MT A - Set Function Code
– MT B - Set Start Address
– MT C - Set Stop Address
– MT D - Set Bus Data Width
– MT E - March Address Test
– MT F - Walk a Bit Test
– MT G - Refresh Test
– MT H - Random Byte Test
– MT I - Program Test
– MT J - TAS Test
Bus error test (BERR) tests for internal bus access time-out and internal to external bus
access time-out error conditions, including:
– Bus errors when accessing the BCC RAM.
– Bus errors when reading the BCC EPROM.
– Bus errors when accessing the PFB optional memory.
– Internal bus access time-outs when reading and writing from an undefined function
code/memory location internal to the MCU.
– Internal to external bus access time-outs reading or writing to an undefined
function code/memory location external to the MCU.