Datasheet

3.0V
13
5min 30min
30min
8. Reliability Test Items and Criteria
Note: Operation: Supply for logic system.
The inspection terms after reliability test, as below
9 Quality level
9.1 Classification of defects
Major defects (MA): A major defect refers to a defect that may substantially
degrade usability for product applications, including all functional defects(such as no
display, abnormal display, open or missing segment, short circuit, missing
component), outline dimension beyond the drawing, progressive defects and those
affecting reliability.
No Test Item Test condition Criterion
1
High Temperature Storage
80℃±2℃ 96H
Restore 2H at 25℃
Power off
1. After testing,
cosmetic and electrical
defects should not
happen.
2. Total current
consumption should
not be more than twice
of initial value.
2
Low Temperature Storage
-30℃±2℃ 96H
Restore 2H at 25℃
Power off
3
High Temperature
Operation
70℃±2℃ 96H
Restore 2H at 25℃
Power on
4
Low Temperature Operation
-20℃±2℃ 96H
Restore 4H at 25℃
Power on
5
High Temperature/Humidity
Operation
60℃±2℃ 90%RH 96H
Power on
6
Temperature Cycle
--30℃←-----------------→80℃
after 5 cycle, Restore 2H at 25℃
Power off
7
Vibration Test 10Hz~150Hz, 100m/s
2
, 120min
Not allowed cosmetic
and electrical defects.
8
Shock Test Half- sine wave,300m/s
2
,11ms
ITEM Inspection
Contrast CR>50%
IDD IDD<200%
Brightness Brightness>60%
Color Tone Color Tone+/-0,05
A-TOPS ELECTRONICS COMPANY