Product data

MFRC631 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2014. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.3 — 4 February 2014
227433 25 of 120
NXP Semiconductors
MFRC631
High performance ISO/IEC 14443 A/B reader solution
8.4.5.2 SAM connection
The MFRC631 provides an interface to connect a SAM dedicated to the MFRC631. Both
interface options of the MFRC631, I
2
C or I
2
CL can be used for this purpose. The interface
option of the SAM itself is configured by a host command sent from the host to the SAM.
The I
2
CL interface is intended to be used as connection between two IC’s over a short
distance. The protocol fulfills the I
2
C specification, but does support a single device
connected to the bus only.
8.4.6 Boundary scan interface
The MFRC631 provides a boundary scan interface according to the IEEE 1149.1. This
interface allows to test interconnections without using physical test probes. This is done
by test cells, assigned to each pin, which override the functionality of this pin.
To be able to program the test cells, the following commands are supported:
The Standard IEEE 1149.1 describes the four basic blocks necessary to use this interface:
Test Access Port (TAP), TAP controller, TAP instruction register, TAP data register;
Fig 20. I2C interface enables convenient MIFARE SAM integration
µC
Reader
T=1 I2C
I2C
aaa-002963
SAM
AV2.6
READER
IC
Table 18. Boundary scan command
Value
(decimal)
Command Parameter in Parameter out
0 bypass - -
1 preload data (24) -
1 sample - data (24)
2 ID code (default) - data (32)
3 USER code - data (32)
4Clamp - -
5HIGH Z - -
7 extest data (24) data (24)
8 interface on/off interface (1) -
9 register access read address (7) data (8)
10 register access write address (7) - data (8) -