Datasheet

 2015 Microchip Technology Inc. DS20005045C-page 19
SST25VF080B
TABLE 5-5: RELIABILITY CHARACTERISTICS
Symbol Parameter Minimum Specification Units Test Method
N
END
1
Endurance 10,000 Cycles JEDEC Standard A117
T
DR
1
Data Retention 100 Years JEDEC Standard A103
I
LTH
1
Latch Up 100 + I
DD
mA JEDEC Standard 78
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 5-6: AC OPERATING CHARACTERISTICS
Symbol Parameter
25 MHz 50 MHz 66 MHz
1,2
1. V
DD
= 3.0 - 3.6 V, CL = 15 pF
2. Characterized, but not fully tested
UnitsMin Max Min Max Min Max
F
CLK
3
3. Maximum clock frequency for Read Instruction, 03H, is 25 MHz
Serial Clock Frequency 25 50 66 MHz
T
SCKH
Serial Clock High Time 18 9 7 ns
T
SCKL
Serial Clock Low Time 18 9 7 ns
T
SCKR
4
4. Maximum Rise and Fall time may be limited by T
SCKH
and T
SCKL
requirements
Serial Clock Rise Time (Slew
Rate)
0.1 0.1 0.1 V/ns
T
SCKF
Serial Clock Fall Time (Slew
Rate)
0.1 0.1 0.1 V/ns
T
CES
5
5. Relative to SCK.
CE# Active Setup Time 10 5 4 ns
T
CEH
5
CE# Active Hold Time 10 5 4 ns
T
CHS
5
CE# Not Active Setup Time 10 5 4 ns
T
CHH
5
CE# Not Active Hold Time 10 5 4 ns
T
CPH
CE# High Time 100 50 100 ns
T
CHZ
CE# High to High-Z Output 15 8 6 ns
T
CLZ
SCK Low to Low-Z Output 000ns
T
DS
Data In Setup Time 522ns
T
DH
Data In Hold Time 553ns
T
HLS
HOLD# Low Setup Time 10 5 4 ns
T
HHS
HOLD# High Setup Time 10 5 4 ns
T
HLH
HOLD# Low Hold Time 10 5 4 ns
T
HHH
HOLD# High Hold Time 10 5 4 ns
T
HZ
HOLD# Low to High-Z Output 20 8 8 ns
T
LZ
HOLD# High to Low-Z Output 15 8 8 ns
T
OH
Output Hold from SCK Change 000ns
T
V
Output Valid from SCK 15 8 6 ns
T
SE
Sector-Erase 25 25 25 ms
T
BE
Block-Erase 25 25 25 ms
T
SCE
Chip-Erase 50 50 50 ms
T
BP
Byte-Program 10 10 10 µs