Datasheet

MCP3221
DS20001732E-page 12  2002-2017 Microchip Technology Inc.
Note: Unless otherwise indicated, V
DD
= 5V, V
SS
= 0V, I
2
C Fast Mode Timing (SCL = 400 kHz), Continuous Conversion
Mode (f
SAMP
= 22.3 ksps), T
A
= +25°C.
FIGURE 2-37: I
DDS
(Standby) vs.
Temperature.
FIGURE 2-38: Analog Input Leakage vs.
Temperature.
2.1 Test Circuits
FIGURE 2-39: Typical Test Configuration.
0.0001
0.001
0.01
0.1
1
10
100
1000
-50 -25 0 25 50 75 100 125
Temperature (°C)
I
DDS
(nA)
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
1.8
2
-50 -25 0 25 50 75 100 125
Temperature (°C)
Analog Input Leakage (nA)
0.1 µF
A
IN
MCP3221
V
DD
= 5V
V
CM
= 2.5V
V
IN
V
DD
V
SS
10 µF
SDA
SCL
2k 2k