Datasheet

 2017-2018 Microchip Technology Inc. DS20005757B-page 15
LM4040/LM4041
Test Circuits
FIGURE 1-1: LM4040.
FIGURE 1-2: LM4041.
FIGURE 1-3: Reverse Characteristics
Test Circuit.
FIGURE 1-4: Output Impedance vs.
Frequency Test Circuit.
FIGURE 1-5: Large Signal Response Test
Circuit.
TEMPERATURE SPECIFICATIONS (Note 1)
Parameters Sym. Min. Typ. Max. Units Conditions
Temperature Ranges
Operating Temperature Range T
A
–40 — +85 °C —
Storage Temperature T
S
–65 — +150 °C —
Lead Temperature — — +215 — °C Vapor phase, 60s
Lead Temperature — — +220 — °C Infrared, 15s
Package Thermal Resistance
3-Pin SOT-23 
JA
— +326 — °C/W —
Note 1: The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable
junction temperature and the thermal resistance from junction to air (i.e., T
A
, T
J
, 
JA
). Exceeding the
maximum allowable power dissipation will cause the device operating junction temperature to exceed the
maximum +125°C rating. Sustained junction temperatures above +125°C can impact the device reliability.
V
IN
1Hz RATE
LM4040
R
S
V
R
R
S
30k
V
IN
1Hz rate
LM4041-1.2
V
R
FB
2V / step
V
OUT
I
R
( + )
( – )
LM4041-ADJ
V
–
+
C
L
120k
FB
I
R
V
OUT
LM4041-ADJ
( + )
FB
( – )
100k
INPUT
+ 15V
5.1k