Datasheet

2017-2018 Microchip Technology Inc. DS20005757B-page 13
LM4040/LM4041
Reverse-Breakdown Voltage
Long-Term Stability
V
R
120 ppm t = 1000 hrs., T
A
= +25°C
±0.1°C, I
R
= 100 µA
LM4041D
Reverse-Breakdown Voltage V
R
1.233 V I
R
= 100 µA, V
OUT
= 5V
Reverse-Breakdown Voltage
Tolerance (Note 2)
——±12mVI
R
= 100 µA, T
A
= +25°C
——±24mVI
R
= 100 µA
Minimum Operating Current I
RMIN
—4565µAT
A
= +25°C
——70
Reference Voltage Change
with Operating Current
V
REF
/
I
R
—0.72.0mVI
RMIN
I
R
1mA,
V
OUT
1.6V (Note 3),
T
A
= +25°C
——2.5 I
RMIN
I
R
1mA,
V
OUT
1.6V (Note 3)
—2.06.0 1mA I
R
12 mA,
V
OUT
1.6V (Note 3),
T
A
= +25°C
——8.0 1mA I
R
12 mA,
V
OUT
1.6V (Note 3)
Reference Voltage Change
with Output Voltage Change
V
REF
/
V
O
–1.55 –2.5 mV/V I
R
= 1 mA, T
A
= +25°C
–3.0 I
R
= 1 mA
Feedback Current I
FB
60 150 nA T
A
= +25°C
200
Average Reference Voltage
Temperature Coefficient
V
REF
/
T
±20 ppm/°C V
OUT
= 5V, I
R
= 10 mA,
T
A
= +25°C
±15 ±150 V
OUT
= 5V, I
R
= 1 mA
—±15 V
OUT
= 5V, I
R
= 100 µA,
T
A
= +25°C
Dynamic Output Impedance Z
OUT
—0.3 I
R
= 1 mA, f = 120 Hz, T
A
=
+25°C, I
AC
= 0.1 I
R
, V
OUT
=
V
REF
——2.0 V
OUT
= 10V, T
A
= +25°C
LM4041-ADJ ELECTRICAL CHARACTERISTICS (Note 1) (CONTINUED)
T
A
= Operating Temperature Range, T
A
= T
J
= –40°C to +85°C, unless noted.
Parameters Sym. Min. Typ. Max. Units Conditions
Note 1: Specification for packaged product only.
2: The boldface (overtemperature) limit for Reverse-Breakdown Voltage Tolerance is defined as the room
temperature Reverse-Breakdown Voltage Tolerance ±[(V
R
/T)(65°C)(V
R
)]. V
R
/T is the V
R
tempera-
ture coefficient, 65°C is the temperature range from –40°C to the reference point of 25°C, and V
R
is the
reverse-breakdown voltage. The total overtemperature tolerance for the different grades follows:
a. C-grade: ±1.15% = ±0.5% ±100 ppm/°C × 65°C
b. D-grade: ±1.98% = ±1.0% ±150 ppm/°C × 65°C
Example: The C-grade LM4040-2.5 has an overtemperature Reverse-Breakdown Voltage tolerance of
±2.5 × 1.15% = ±29 mV.
3: When V
OUT
1.6V, the LM4041-ADJ must operate at reduced I
R
. This is caused by the series resistance
of the die attach between the die (-) output and the package (-) output pin. See the Output Saturation
curve in the Typical Performance Curves section.