Datasheet

Micrel, Inc. KS8999
January 2005
18
KS8999
Group I/O Names Active Status Description
DOUT H Factory test output –leave open for normal operation
AOUT2 H Factory test output –leave open for normal operation
DOUT2 H Factory test output –leave open for normal operation
BTOUT H Factory test output –leave open for normal operation
CTOUT H Factory test output –leave open for normal operation
BTOUT2 H Factory test output –leave open for normal operation
CTOUT2 H Factory test output –leave open for normal operation
TEST[1:2] H Factory test inputs –leave open for normal operation
AUTOMDIX H F/U = Enable Auto MDI/MDIX (normal operation) D = Disable Auto MDI/MDIX
T[1:3] & T[5] H Factory test inputs –leave open (float) for normal operation
T[4] H F/D = normal operation (default) U = Disable FEF
QH[2:5] H Factory test outputs –leave open for normal operation
QL[2:5] H Factory test outputs –leave open for normal operation
IO_SWM H Factory test input –tie high for normal operation
RLPBK H Factory test input –tie low for normal operation
BIST H Factory test input –tie low for normal operation
PWR VDD_RX 2.0V for equalizer
GND_RX Ground for equalizer
VDD_TX 2.0V for transmit circuitry
GND_TX Ground for transmit circuitry
VDD_RCV 2.0V for clock recovery circuitry
GND_RCV Ground for clock recovery
VDD_PLLTX 2.0V for phase locked loop circuitry
GND_PLLTX Ground for phase locked loop circuitry
GND-ISO Analog ground
VDD 2.0V for core digital circuitry
VDD-IO 2.0V, 2.5V or 3.3V for I/O circuitry
GND Ground for digital circuitry
Note:
1. All unmanaged programming takes place at reset time only. For unmanaged programming: F = Float, D = Pull-down, U = Pull-up.
See “Reference Circuits” section.