Datasheet
dsPIC33EPXXXGM3XX/6XX/7XX
DS70000689D-page 500 2013-2014 Microchip Technology Inc.
34.1 High-Temperature DC Characteristics
TABLE 34-1: OPERATING MIPS VS. VOLTAGE
TABLE 34-2: THERMAL OPERATING CONDITIONS
TABLE 34-3: DC TEMPERATURE AND VOLTAGE SPECIFICATIONS
TABLE 34-4: DC CHARACTERISTICS: POWER-DOWN CURRENT (I
PD)
Characteristic
V
DD Range
(in Volts)
Temperature Range
(in °C)
Max MIPS
dsPIC33EPXXXGM3XX/6XX/7XX
HDC5 3.0 to 3.6V
(1)
-40°C to +150°C 40
Note 1: Device is functional at VBORMIN < VDD < VDDMIN. Analog modules, such as the ADC, may have degraded
performance. Device functionality is tested but not characterized.
Rating Symbol Min Typ Max Unit
High-Temperature Devices
Operating Junction Temperature Range T
J -40 — +155 °C
Operating Ambient Temperature Range TA -40 — +150 °C
Power Dissipation:
Internal Chip Power Dissipation:
P
INT = VDD x (IDD – IOH)
PD PINT + PI/O W
I/O Pin Power Dissipation:
I/O = ({V
DD – VOH} x IOH) + (VOL x IOL)
Maximum Allowed Power Dissipation PDMAX (TJ – TA)/JA W
DC CHARACTERISTICS
Standard Operating Conditions: 3.0V to 3.6V
(unless otherwise stated)
Operating temperature -40°C T
A +150°C
Parameter
No.
Symbol Characteristic Min Typ Max Units Conditions
Operating Voltage
HDC10 Supply Voltage
V
DD — 3.0 3.3 3.6 V -40°C to +150°C
DC CHARACTERISTICS
Standard Operating Conditions: 3.0V to 3.6V
(unless otherwise stated)
Operating temperature -40°C T
A +150°C
Parameter
No.
Typical Max Units Conditions
Power-Down Current (I
PD)
HDC60e 4.1 6 mA +150°C 3.3V Base Power-Down Current
(Notes 1, 3)
HDC61c 15 30 A +150°C 3.3V Watchdog Timer Current: I
WDT
(Notes 2, 4)
Note 1: Base I
PD is measured with all peripherals and clocks shut down. All I/Os are configured as inputs and
pulled to V
SS. WDT, etc., are all switched off and VREGS (RCON<8>) = 1.
2: The current is the additional current consumed when the module is enabled. This current should be
added to the base I
PD current.
3: These currents are measured on the device containing the most memory in this family.
4: These parameters are characterized, but are not tested in manufacturing.