Datasheet

Figure 58-14. Gain and Offset Errors in Single-ended Mode
V
IN
Single-ended
4095
V
REFP
0
V
REFP
/2
2047
AFE codes
E
FS
=Full-scale erro
r
E
G
=Gain error=E
FS
-E
O
E
O
=Offset error
where:
• Full-scale error E
FS
=(E
FS+
)-(E
FS-
), unit is LSB code
• Offset error E
O
is the offset error measured for V
REFP/2
= 0V
• Gain error E
G
=100 x E
FS
/4096, unit in %
The error values in the tables below include the DAC, the sample-and-hold error as well as the PGA gain error.
58.8.5 AFE Electrical Characteristics
Table 58-34. AFE INL and DNL, f
AFE CLOCK
= < 20 MHz Maximum, IBCTL = 10
Symbol Parameter Conditions Min. Typ. Max. Unit
Differential Mode
INL Integral Non-Linearity
Gain = 1
-4
±0.7
4 LSBGain = 2 ±1
Gain = 4 ±1.2
DNL Differential Non-Linearity – -2 ±0.6 2 LSB
Single-Ended Mode
INL Integral Non-Linearity
Gain = 1
-6
±1
4 LSBGain = 2 ±1.3
Gain = 4 ±1.7
DNL Differential Non-Linearity – -2 ±0.6 2 LSB
Note: INL/DNL given inside the linear range of the AFE: 2% to 98% of VREFP
.
Table 58-35. AFE INL and DNL, f
AFE CLOCK
= > 20 MHz to 40 MHz, IBCTL = 11
Symbol Parameter Conditions Min. Typ. Max. Unit
Differential Mode
INL Integral Non-Linearity
Gain = 1
-12
±2
12 LSBGain = 2 ±2.1
Gain = 4 ±2.5
DNL Differential Non-Linearity – -6 ±2 6 LSB
Single-Ended Mode
SAM E70/S70/V70/V71 Family
Electrical Characteristics for SAM ...
© 2019 Microchip T
echnology Inc.
Datasheet
DS60001527D-page 1838