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37.2 Thermal Considerations

37.3 Absolute Maximum Ratings

Stresses beyond those listed in this section may cause permanent damage to the device. This is a stress

rating only and functional operation of the device at these or other conditions beyond those indicated in

the operational sections of this specification is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect device reliability.

Table 37-2. Absolute Maximum Ratings

Symbol Description Min. Max. Units

Power supply voltage 0 3.8 V

VDD

Current into a V

pin - 92

(1)

GND

Current out of a GND pin - 130

(1)

Pin voltage with respect to GND and V

GND-0.6V V

+0.6V V

storage

Storage temperature -60 150 °C

1. Maximum source current is 46mA and maximum sink current is 65mA per cluster. A cluster is a

group of GPIOs as shown in the table below. Also note that each VDD/GND pair is connected to

two clusters so current consumption through the pair will be a sum of the clusters source/sink

currents.

CAUTION

This device is sensitive to electrostatic discharges (ESD). Improper handling may lead to

permanent performance degradation or malfunctioning.

Handle the device following best practice ESD protection rules: Be aware that the human body

can accumulate charges large enough to impair functionality or destroy the device.

CAUTION

In debugger cold-plugging mode, NVM erase operations are not protected by the BOD33 and

BOD12. NVM erase operation at supply voltages below specified minimum can cause

corruption of NVM areas that are mandatory for correct device behavior.