Datasheet

SAM3X / SAM3A [DATASHEET]
Atmel-11057C-ATARM-SAM3X-SAM3A-Datasheet_23-Mar-15
216
Figure 11-3. Application Test Environment Example
11.4 Debug and Test Pin Description
Note: 1. TDO pin is set in input mode when the Cortex-M3 Core is not in debug mode. Thus the internal pull-up
corresponding to this PIO line must be enabled to avoid current consumption due to floating input.
Chip 2
Chip n
Chip 1 SAM3
SAM3-based Application Board In Test
JTAG
Connector
Tester
Test Adaptor
JTAG
Probe
Table 11-1. Debug and Test Signal List
Signal Name Function Type Active Level
Reset/Test
NRST Microcontroller Reset Input/Output Low
TST Test Select Input
SWD/JTAG
TCK/SWCLK Test Clock/Serial Wire Clock Input
TDI Test Data In Input
TDO/TRACESWO Test Data Out/Trace Asynchronous Data Out Output
(1)
TMS/SWDIO Test Mode Select/Serial Wire Input/Output Input
JTAGSEL JTAG Selection Input High