Datasheet

26. JTAG Interface and On-chip Debug System

26.1. Features

• JTAG (IEEE std. 1149.1 Compliant) Interface

• Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard

• Debugger Access to:

– All Internal Peripheral Units

– Internal and External RAM

– The Internal Register File

– Program Counter

– EEPROM and Flash Memories

• Extensive On-chip Debug Support for Break Conditions, Including:

– AVR Break Instruction

– Break on Change of Program Memory Flow

– Single Step Break

– Program Memory Breakpoints on Single Address or Address Range

– Data Memory Breakpoints on Single Address or Address Range

• Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface

• On-chip Debugging Supported by Atmel Studio

26.2. Overview

The AVR IEEE std. 1149.1 compliant JTAG interface can be used for:

• Testing PCBs by using the JTAG Boundary-scan capability

• Programming the non-volatile memories, Fuses and Lock bits

• On-chip debugging

A brief description is given in the following sections. Detailed descriptions for Programming via the JTAG

interface, and using the Boundary-scan Chain can be found in the sections Programming Via the JTAG

Interface and IEEE 1149.1 (JTAG) Boundary-scan, respectively. The On-chip Debug support is

considered being private JTAG instructions, and distributed within ATMEL and to selected third party

vendors only.

Figure 26-1 shows the JTAG interface and the On-chip Debug system. The TAP Controller is a state

machine controlled by the TCK and TMS signals. The TAP Controller selects either the JTAG Instruction

TDO – output. The Instruction Register holds JTAG instructions controlling the behavior of a Data

The ID-Register, Bypass Register, and the Boundary-scan Chain are the data registers used for board-

level testing. The JTAG Programming Interface (actually consisting of several physical and virtual Data

Registers) is used for serial programming via the JTAG interface. The Internal Scan Chain and Break

Point Scan Chain are used for On-chip debugging only.