Datasheet

6
0453H–PLD–7/05
ATF16V8CZ
4.4 Input Test Waveforms
4.4.1 Input Test Waveforms and Measurement Levels
t
R
, t
F
< 1.5 ns (10% to 90%)
4.4.2 Output Test Loads
Note: Similar devices are tested with slightly different loads. These load differences may affect output
signals' delay and slew rate. Atmel devices are tested with sufficient margins to meet compatible
devices.
4.4.3 Pin Capacitance
Note: 1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100%
tested.
Table 4-1. Pin Capacitance (f = 1 MHz, T = 25°C
(1)
)
Typ Max Units Conditions
C
IN
58 pF V
IN
= 0V
C
OUT
68 pF V
OUT
= 0V