Datasheet

Table Of Contents
49
SAM7S Series [DATASHEET]
6175M–ATARM–26-Oct-12
12.3.2 Test Environment
Figure 12-3 on page 49 shows a test environment example. Test vectors are sent and interpreted by the tester. In
this example, the “board in test” is designed using a number of JTAG-compliant devices. These devices can be
connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
JTAG
Interface
ICE/JTAG
Connector
Test Adaptor
Chip 2Chip n
Chip 1
SAM7S
Tester
SAM7S-based Application Board In Test