Datasheet
Table Of Contents
- 1. Description
- 2. About Code Examples
- 3. AVR CPU Core
- 4. Memories
- 5. System Clock
- 6. Power Management and Sleep Modes
- 7. System Control and Reset
- 8. Interrupts
- 9. I/O-Ports
- 10. External Interrupts
- 11. Timer/Counter3/1/0 Prescalers
- 12. 8-bit Timer/Counter0 with PWM
- 13. 16-bit Timer/Counter (Timer/Counter1 and Timer/Counter3)
- 14. 8-bit Timer/Counter2 with PWM and Asynchronous Operation
- 14.1 Features
- 14.2 Overview
- 14.3 Timer/Counter Clock Sources
- 14.4 Counter Unit
- 14.5 Output Compare Unit
- 14.6 Compare Match Output Unit
- 14.7 Modes of Operation
- 14.8 Timer/Counter Timing Diagrams
- 14.9 8-bit Timer/Counter Register Description
- 14.10 Asynchronous operation of the Timer/Counter2
- 14.11 Timer/Counter2 Prescaler
- 15. Output Compare Modulator - OCM
- 16. Serial Peripheral Interface - SPI
- 17. USART (USART0 and USART1)
- 17.1 Features
- 17.2 Overview
- 17.3 Dual USART
- 17.4 Clock Generation
- 17.5 Serial Frame
- 17.6 USART Initialization
- 17.7 Data Transmission - USART Transmitter
- 17.8 Data Reception - USART Receiver
- 17.9 Asynchronous Data Reception
- 17.10 Multi-processor Communication Mode
- 17.11 USART Register Description
- 17.12 Examples of Baud Rate Setting
- 18. Two-wire Serial Interface
- 19. Controller Area Network - CAN
- 20. Analog Comparator
- 21. Analog to Digital Converter - ADC
- 22. JTAG Interface and On-chip Debug System
- 23. Boundary-scan IEEE 1149.1 (JTAG)
- 24. Boot Loader Support - Read-While-Write Self-Programming
- 25. Memory Programming
- 26. Electrical Characteristics (1)
- 26.1 Absolute Maximum Ratings*
- 26.2 DC Characteristics
- 26.3 External Clock Drive Characteristics
- 26.4 Maximum Speed vs. VCC
- 26.5 Two-wire Serial Interface Characteristics
- 26.6 SPI Timing Characteristics
- 26.7 CAN Physical Layer Characteristics
- 26.8 ADC Characteristics
- 26.9 External Data Memory Characteristics
- 26.10 Parallel Programming Characteristics
- 27. Decoupling Capacitors
- 28. AT90CAN32/64/128 Typical Characteristics
- 28.1 Active Supply Current
- 28.2 Idle Supply Current
- 28.3 Power-down Supply Current
- 28.4 Power-save Supply Current
- 28.5 Standby Supply Current
- 28.6 Pin Pull-up
- 28.7 Pin Driver Strength
- 28.8 Pin Thresholds and Hysteresis
- 28.9 BOD Thresholds and Analog Comparator Offset
- 28.10 Internal Oscillator Speed
- 28.11 Current Consumption of Peripheral Units
- 28.12 Current Consumption in Reset and Reset Pulse Width
- 29. Register Summary
- 30. Instruction Set Summary
- 31. Ordering Information
- 32. Packaging Information
- 33. Errata
- 34. Datasheet Revision History for AT90CAN32/64/128
- 34.1 Changes from 7679G - 03/08 to 7679H - 08/08
- 34.2 Changes from 7679F - 11/07 to 7679G - 03/08
- 34.3 Changes from 7679E - 07/07 to 7679F - 11/07
- 34.4 Changes from 7679D - 02/07 to 7679E - 07/07
- 34.5 Changes from 7679C - 01/07 to 7679D - 02/07
- 34.6 Changes from 7679B - 11/06 to 7679C - 01/07
- 34.7 Changes from 7679A - 10/06 to 7679B - 11/06
- 34.8 Document Creation

353
7679H–CAN–08/08
AT90CAN32/64/128
the JTAG pins for Boundary-scan or On-chip Debug. In these cases the JTAG pins must be ded-
icated for this purpose.
During programming the clock frequency of the TCK Input must be less than the maximum fre-
quency of the chip. The System Clock Prescaler can not be used to divide the TCK Clock Input
into a sufficiently low frequency.
As a definition in this datasheet, the LSB is shifted in and out first of all Shift Registers.
25.9.1 Programming Specific JTAG Instructions
The instruction register is 4-bit wide, supporting up to 16 instructions. The JTAG instructions
useful for programming are listed below.
The OPCODE for each instruction is shown behind the instruction name in hex format. The text
describes which data register is selected as path between TDI and TDO for each instruction.
The Run-Test/Idle state of the TAP controller is used to generate internal clocks. It can also be
used as an idle state between JTAG sequences. The state machine sequence for changing the
instruction word is shown in Figure 25-9.
Figure 25-9. State Machine Sequence for Changing the Instruction Word
Test-Logic-Reset
Run-Test/Idle
Shift-DR
Exit1-DR
Pause-DR
Exit2-DR
Update-DR
Select-IR Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Exit2-IR
Update-IR
Select-DR Scan
Capture-DR
0
1
0
11 1
00
00
11
1
0
1
1
0
1
0
0
1
0
1
1
0
1
0
0
00
11