Datasheet
Table Of Contents
- 1. Description
- 2. About Code Examples
- 3. AVR CPU Core
- 4. Memories
- 5. System Clock
- 6. Power Management and Sleep Modes
- 7. System Control and Reset
- 8. Interrupts
- 9. I/O-Ports
- 10. External Interrupts
- 11. Timer/Counter3/1/0 Prescalers
- 12. 8-bit Timer/Counter0 with PWM
- 13. 16-bit Timer/Counter (Timer/Counter1 and Timer/Counter3)
- 14. 8-bit Timer/Counter2 with PWM and Asynchronous Operation
- 14.1 Features
- 14.2 Overview
- 14.3 Timer/Counter Clock Sources
- 14.4 Counter Unit
- 14.5 Output Compare Unit
- 14.6 Compare Match Output Unit
- 14.7 Modes of Operation
- 14.8 Timer/Counter Timing Diagrams
- 14.9 8-bit Timer/Counter Register Description
- 14.10 Asynchronous operation of the Timer/Counter2
- 14.11 Timer/Counter2 Prescaler
- 15. Output Compare Modulator - OCM
- 16. Serial Peripheral Interface - SPI
- 17. USART (USART0 and USART1)
- 17.1 Features
- 17.2 Overview
- 17.3 Dual USART
- 17.4 Clock Generation
- 17.5 Serial Frame
- 17.6 USART Initialization
- 17.7 Data Transmission - USART Transmitter
- 17.8 Data Reception - USART Receiver
- 17.9 Asynchronous Data Reception
- 17.10 Multi-processor Communication Mode
- 17.11 USART Register Description
- 17.12 Examples of Baud Rate Setting
- 18. Two-wire Serial Interface
- 19. Controller Area Network - CAN
- 20. Analog Comparator
- 21. Analog to Digital Converter - ADC
- 22. JTAG Interface and On-chip Debug System
- 23. Boundary-scan IEEE 1149.1 (JTAG)
- 24. Boot Loader Support - Read-While-Write Self-Programming
- 25. Memory Programming
- 26. Electrical Characteristics (1)
- 26.1 Absolute Maximum Ratings*
- 26.2 DC Characteristics
- 26.3 External Clock Drive Characteristics
- 26.4 Maximum Speed vs. VCC
- 26.5 Two-wire Serial Interface Characteristics
- 26.6 SPI Timing Characteristics
- 26.7 CAN Physical Layer Characteristics
- 26.8 ADC Characteristics
- 26.9 External Data Memory Characteristics
- 26.10 Parallel Programming Characteristics
- 27. Decoupling Capacitors
- 28. AT90CAN32/64/128 Typical Characteristics
- 28.1 Active Supply Current
- 28.2 Idle Supply Current
- 28.3 Power-down Supply Current
- 28.4 Power-save Supply Current
- 28.5 Standby Supply Current
- 28.6 Pin Pull-up
- 28.7 Pin Driver Strength
- 28.8 Pin Thresholds and Hysteresis
- 28.9 BOD Thresholds and Analog Comparator Offset
- 28.10 Internal Oscillator Speed
- 28.11 Current Consumption of Peripheral Units
- 28.12 Current Consumption in Reset and Reset Pulse Width
- 29. Register Summary
- 30. Instruction Set Summary
- 31. Ordering Information
- 32. Packaging Information
- 33. Errata
- 34. Datasheet Revision History for AT90CAN32/64/128
- 34.1 Changes from 7679G - 03/08 to 7679H - 08/08
- 34.2 Changes from 7679F - 11/07 to 7679G - 03/08
- 34.3 Changes from 7679E - 07/07 to 7679F - 11/07
- 34.4 Changes from 7679D - 02/07 to 7679E - 07/07
- 34.5 Changes from 7679C - 01/07 to 7679D - 02/07
- 34.6 Changes from 7679B - 11/06 to 7679C - 01/07
- 34.7 Changes from 7679A - 10/06 to 7679B - 11/06
- 34.8 Document Creation

313
7679H–CAN–08/08
AT90CAN32/64/128
Note: 1. Incorrect setting of the switches in Figure 23-10 will make signal contention and may damage
the part. There are several input choices to the S&H circuitry on the negative input of the out-
put comparator in Figure 23-10. Make sure only one path is selected from either one ADC pin,
Bandgap reference source, or Ground.
If the ADC is not to be used during scan, the recommended input values from Table 23-7 should
be used. The user is recommended not to use the Differential Gain stages during scan. Switch-
Cap based gain stages require fast operation and accurate timing which is difficult to obtain
when used in a scan chain. Details concerning operations of the differential gain stage is there-
fore not provided.
The AVR ADC is based on the analog circuitry shown in Figure 23-10 with a successive approx-
imation algorithm implemented in the digital logic. When used in Boundary-scan, the problem is
usually to ensure that an applied analog voltage is measured within some limits. This can easily
be done without running a successive approximation algorithm: apply the lower limit on the digi-
tal DAC[9:0] lines, make sure the output from the comparator is low, then apply the upper limit
on the digital DAC[9:0] lines, and verify the output from the comparator to be high.
The ADC need not be used for pure connectivity testing, since all analog inputs are shared with
a digital port pin as well.
When using the ADC, remember the following
• The port pin for the ADC channel in use must be configured to be an input with pull-up
disabled to avoid signal contention.
• In Normal mode, a dummy conversion (consisting of 10 comparisons) is performed when
enabling the ADC. The user is advised to wait at least 200ns after enabling the ADC before
controlling/observing any ADC signal, or perform a dummy conversion before using the first
result.
• The DAC values must be stable at the midpoint value 0x200 when having the HOLD signal
low (Sample mode).
As an example, consider the task of verifying a 1.5V ± 5% input signal at ADC channel 3 when
the power supply is 5.0V and AREF is externally connected to V
CC.
SCTEST Input
Switch-cap TEST
enable. Output from x10
gain stage send out to
Port Pin having ADC_4
00
ST Input
Output of gain stages will
settle faster if this signal
is high first two ACLK
periods after AMPEN
goes high.
00
VCCREN Input
Selects Vcc as the ACC
reference voltage.
00
The lower limit is: [ 1024 * 1.5V * 0.95 / 5V ] = 291 = 0x123
The upper limit is: [ 1024 * 1.5V * 1.05 / 5V ] = 323 = 0x143
Table 23-7. Boundary-scan Signals for the ADC
(1)
(Continued)
Signal
Name
Direction
as Seen
from the
ADC
Description
Recommended
Input
when not in use
Output Values when
Recommended Inputs
are Used, and CPU is
not Using the ADC