Datasheet
Table Of Contents
- 1. Description
- 2. About Code Examples
- 3. AVR CPU Core
- 4. Memories
- 5. System Clock
- 6. Power Management and Sleep Modes
- 7. System Control and Reset
- 8. Interrupts
- 9. I/O-Ports
- 10. External Interrupts
- 11. Timer/Counter3/1/0 Prescalers
- 12. 8-bit Timer/Counter0 with PWM
- 13. 16-bit Timer/Counter (Timer/Counter1 and Timer/Counter3)
- 14. 8-bit Timer/Counter2 with PWM and Asynchronous Operation
- 14.1 Features
- 14.2 Overview
- 14.3 Timer/Counter Clock Sources
- 14.4 Counter Unit
- 14.5 Output Compare Unit
- 14.6 Compare Match Output Unit
- 14.7 Modes of Operation
- 14.8 Timer/Counter Timing Diagrams
- 14.9 8-bit Timer/Counter Register Description
- 14.10 Asynchronous operation of the Timer/Counter2
- 14.11 Timer/Counter2 Prescaler
- 15. Output Compare Modulator - OCM
- 16. Serial Peripheral Interface - SPI
- 17. USART (USART0 and USART1)
- 17.1 Features
- 17.2 Overview
- 17.3 Dual USART
- 17.4 Clock Generation
- 17.5 Serial Frame
- 17.6 USART Initialization
- 17.7 Data Transmission - USART Transmitter
- 17.8 Data Reception - USART Receiver
- 17.9 Asynchronous Data Reception
- 17.10 Multi-processor Communication Mode
- 17.11 USART Register Description
- 17.12 Examples of Baud Rate Setting
- 18. Two-wire Serial Interface
- 19. Controller Area Network - CAN
- 20. Analog Comparator
- 21. Analog to Digital Converter - ADC
- 22. JTAG Interface and On-chip Debug System
- 23. Boundary-scan IEEE 1149.1 (JTAG)
- 24. Boot Loader Support - Read-While-Write Self-Programming
- 25. Memory Programming
- 26. Electrical Characteristics (1)
- 26.1 Absolute Maximum Ratings*
- 26.2 DC Characteristics
- 26.3 External Clock Drive Characteristics
- 26.4 Maximum Speed vs. VCC
- 26.5 Two-wire Serial Interface Characteristics
- 26.6 SPI Timing Characteristics
- 26.7 CAN Physical Layer Characteristics
- 26.8 ADC Characteristics
- 26.9 External Data Memory Characteristics
- 26.10 Parallel Programming Characteristics
- 27. Decoupling Capacitors
- 28. AT90CAN32/64/128 Typical Characteristics
- 28.1 Active Supply Current
- 28.2 Idle Supply Current
- 28.3 Power-down Supply Current
- 28.4 Power-save Supply Current
- 28.5 Standby Supply Current
- 28.6 Pin Pull-up
- 28.7 Pin Driver Strength
- 28.8 Pin Thresholds and Hysteresis
- 28.9 BOD Thresholds and Analog Comparator Offset
- 28.10 Internal Oscillator Speed
- 28.11 Current Consumption of Peripheral Units
- 28.12 Current Consumption in Reset and Reset Pulse Width
- 29. Register Summary
- 30. Instruction Set Summary
- 31. Ordering Information
- 32. Packaging Information
- 33. Errata
- 34. Datasheet Revision History for AT90CAN32/64/128
- 34.1 Changes from 7679G - 03/08 to 7679H - 08/08
- 34.2 Changes from 7679F - 11/07 to 7679G - 03/08
- 34.3 Changes from 7679E - 07/07 to 7679F - 11/07
- 34.4 Changes from 7679D - 02/07 to 7679E - 07/07
- 34.5 Changes from 7679C - 01/07 to 7679D - 02/07
- 34.6 Changes from 7679B - 11/06 to 7679C - 01/07
- 34.7 Changes from 7679A - 10/06 to 7679B - 11/06
- 34.8 Document Creation

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7679H–CAN–08/08
AT90CAN32/64/128
23.4.1 EXTEST (0x0)
Mandatory JTAG instruction for selecting the Boundary-scan Chain as data register for testing
circuitry external to the AVR package. For port-pins, Pull-up Disable, Output Control, Output
Data, and Input Data are all accessible in the scan chain. For Analog circuits having off-chip
connections, the interface between the analog and the digital logic is in the scan chain. The con-
tents of the latched outputs of the Boundary-scan chain is driven out as soon as the JTAG IR-
Register is loaded with the EXTEST instruction.
The active states are:
• Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
• Shift-DR: The Internal Scan Chain is shifted by the TCK input.
• Update-DR: Data from the scan chain is applied to output pins.
23.4.2 IDCODE (0x1)
Optional JTAG instruction selecting the 32 bit ID-Register as data register. The ID-Register con-
sists of a version number, a device number and the manufacturer code chosen by JEDEC. This
is the default instruction after power-up.
The active states are:
• Capture-DR: Data in the IDCODE Register is sampled into the Boundary-scan Chain.
• Shift-DR: The IDCODE scan chain is shifted by the TCK input.
23.4.3 SAMPLE_PRELOAD (0x2)
Mandatory JTAG instruction for pre-loading the output latches and taking a snap-shot of the
input/output pins without affecting the system operation. However, the output latches are not
connected to the pins. The Boundary-scan Chain is selected as data register.
The active states are:
• Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
• Shift-DR: The Boundary-scan Chain is shifted by the TCK input.
• Update-DR: Data from the Boundary-scan chain is applied to the output latches. However,
the output latches are not connected to the pins.
23.4.4 AVR_RESET (0xC)
The AVR specific public JTAG instruction for forcing the AVR device into the Reset mode or
releasing the JTAG reset source. The TAP controller is not reset by this instruction. The one bit
Reset Register is selected as data register.
Note that the reset will be active as long as there is a logic “one” in the Reset Chain.
The output from this chain is not latched.
The active states are:
• Shift-DR: The Reset Register is shifted by the TCK input.
23.4.5 BYPASS (0xF)
Mandatory JTAG instruction selecting the Bypass Register for data register.
The active states are:
• Capture-DR: Loads a logic “0” into the Bypass Register.