Datasheet
7
0015P–EPROM–10/11
Atmel AT27C512R
Table 5-6. DC programming characteristics
Table 5-7. AC programming characteristics
Notes: 1. V
CC
must be applied simultaneously with or before OE/V
PP
and removed simultaneously with or after OE/V
PP
.
2. This parameter is only sampled, and is not 100% tested. Output float is defined as the point where data is no longer driven.
See timing diagram.
3. Program pulse width tolerance is 100µsec±5%.
Table 5-8. The Atmel AT27C512R integrated product identification code
T
A
= 25 ± 5°C, V
CC
= 6.5 ± 0.25V, OE/V
PP
= 13.0 ± 0.25V
Symbol Parameter Test conditions
Limits
UnitsMin Max
I
LI
Input load current V
IN
= V
IL
,V
IH
±10 µA
V
IL
Input low level -0.6 0.8 V
V
IH
Input high level 2.0 V
CC
+ 1 V
V
OL
Output low voltage I
OL
= 2.1mA 0.4 V
V
OH
Output high voltage I
OH
= -400µA 2.4 V
I
CC2
V
CC
supply current (program and verify) 25 mA
I
PP2
OE/V
PP
current CE = V
IL
25 mA
V
ID
A9 product identification voltage 11.5 12.5 V
T
A
= 25 5°C, V
CC
= 6.5 0.25V, OE/V
PP
= 13.0 0.25V
Symbol Parameter Test conditions
(1)
Limits
UnitsMin Max
t
AS
Address setup time
Input rise and fall times
(10% to 90%) 20ns
Input pulse levels
0.45V to 2.4V
Input timing reference level
0.8V to 2.0V
Output timing reference level
0.8V to 2.0V
2µs
t
OES
OE/V
PP
setup time 2 µs
t
OEH
OE/V
PP
hold time 2 µs
t
DS
Data setup time 2 µs
t
AH
Address hold time 0 µs
t
DH
Data hold time 2 µs
t
DFP
CE high to output float delay
(2)
0 130 ns
t
VCS
V
CC
setup time 2 µs
t
PW
CE program pulse width
(3)
95 105 µs
t
DV
Data valid from CE
(2)
1µs
t
VR
OE/V
PP
recovery time 2 µs
t
PRT
OE/V
PP
pulse rise time during
programming
50 ns
Codes
Pins
Hex dataA0 O7 O6 O5 O4 O3 O2 O1 O0
Manufacturer 0 0 0 0 1 1 1 1 0 1E
Device type 1 0 0 0 0 1 1 0 1 0D