Datasheet

25XX080A/B
DS21808D-page 4 © 2007 Microchip Technology Inc.
TABLE 1-3: AC TEST CONDITIONS
17 THH HOLD Hold Time 20
40
80
—
—
—
ns
ns
ns
4.5V ≤ VCC ≤ 5.5V
2.5V ≤ V
CC < 4.5V
1.8V ≤ V
CC < 2.5V
18 T
HZ HOLD Low to Output
High-Z
30
60
160
—
—
—
ns
ns
ns
4.5V ≤ V
CC ≤ 5.5V (Note 1)
2.5V ≤ V
CC < 4.5V (Note 1)
1.8V ≤ V
CC < 2.5V (Note 1)
19 T
HV HOLD High to Output
Valid
30
60
160
—
—
—
ns
ns
ns
4.5V ≤ VCC ≤ 5.5V
2.5V ≤ V
CC < 4.5V
1.8V ≤ V
CC < 2.5V
20 T
WC Internal Write Cycle Time — 5 ms (Note 3)
21 — Endurance 1,000,000 — E/W
Cycles
(Note 2)
TABLE 1-2: AC CHARACTERISTICS (CONTINUED)
AC CHARACTERISTICS
Industrial (I): T
AMB = -40°C to +85°C VCC = 1.8V to 5.5V
Automotive (E): T
AMB = -40°C to +125°C VCC = 2.5V to 5.5V
Param.
No.
Sym. Characteristic Min. Max. Units Test Conditions
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from our web site:
www.microchip.com.
3: T
WC begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
AC Waveform:
VLO = 0.2V —
V
HI = VCC - 0.2V (Note 1)
VHI = 4.0V (Note 2)
Timing Measurement Reference Level
Input 0.5 V
CC
Output 0.5 VCC
Note 1: For VCC ≤ 4.0V
2: For V
CC > 4.0V