Datasheet

 2003-2019 Microchip Technology Inc. DS20001822H-page 4
25AA256/25LC256
TABLE 1-3: AC TEST CONDITIONS
18 THZ HOLD Low to Output
High-Z
—
—
—
30
60
160
ns
ns
ns
4.5V Vcc  5.5V (Note 1)
2.5V Vcc  4.5V (Note 1)
1.8V Vcc  2.5V (Note 1)
19 T
HV HOLD High to Output
Valid
—
—
—
30
60
160
ns
ns
ns
4.5V Vcc  5.5V
2.5V Vcc  4.5V
1.8V Vcc  2.5V
20 TWC Internal Write Cycle
Time
—5ms(Note 2)
21 — Endurance 1M — E/W
Cycles
25°C, V
CC = 5.5V (Note 3)
TABLE 1-2: AC CHARACTERISTICS (CONTINUED)
AC CHARACTERISTICS
Industrial (I): T
A = -40°C to +85°C VCC = 1.8V to 5.5V
Extended (E): T
A = -40°C to +125°C VCC = 1.8V to 5.5V
Param.
No.
Sym. Characteristic Min. Max. Units Test Conditions
Note 1: This parameter is periodically sampled and not 100% tested.
2: T
WC begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
3: This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from Microchip’s website
at www.microchip.com.
AC Waveform:
V
LO = 0.2V —
VHI = VCC – 0.2V (Note 1)
VHI = 4.0V (Note 2)
C
L = 50 pF —
Timing Measurement Reference Level
Input 0.5 VCC
Output 0.5 VCC
Note 1: For VCC  4.0V
2: For V
CC > 4.0V