Datasheet

25AA02E48
DS22123B-page 4  2010 Microchip Technology Inc.
TABLE 1-3: AC TEST CONDITIONS
17 THH HOLD Hold Time 20
40
80
—
—
—
ns
ns
ns
4.5V V
CC  5.5V
2.5V V
CC  4.5V
1.8V V
CC  2.5V
18 T
HZ HOLD Low to Output
High-Z
30
60
160
—
—
—
ns
ns
ns
4.5V VCC  5.5V (Note 1)
2.5V V
CC  4.5V (Note 1)
1.8V V
CC  2.5V (Note 1)
19 T
HV HOLD High to Output
Valid
30
60
160
—
—
—
ns
ns
ns
4.5V VCC  5.5V
2.5V V
CC  4.5V
1.8V V
CC  2.5V
20 T
WC Internal Write Cycle Time
(byte or page)
—5ms(Note 3)
21 — Endurance 1M — E/W
Cycles
(NOTE 2)
TABLE 1-2: AC CHARACTERISTICS (CONTINUED)
AC CHARACTERISTICS Industrial (I): TA = -40°C to +85°C VCC = 1.8V to 5.5V
Param.
No.
Sym. Characteristic Min. Max. Units Test Conditions
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from Microchip’s web site
at www.Microchip.com.
3: T
WC begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
AC Waveform:
VLO = 0.2V —
VHI = VCC - 0.2V (Note 1)
V
HI = 4.0V (Note 2)
CL = 100 pF —
Timing Measurement Reference Level
Input 0.5 V
CC
Output 0.5 VCC
Note 1: For VCC  4.0V
2: For V
CC  4.0V