Datasheet
Automotive Applications Design Guide 3
Quality to Serve the Automotive Market
Our manufacturing meets the demanding quality and
logistics requirements imposed by the automotive market
environment. In 2003, Microchip became one of the first
semiconductor manufacturers to achieve ISO/TS-16949
certification.
Microchip Technology
Automotive Certification History
Tempe, AZ – Fab
ISO 9001 Registered (1996)
ISO/TS 16949 Registration (2003)
Recertification (2006)
Gresham, OR – Fab
ISO/TS 16949 Registration (2004)
Recertification (2006)
Bangkok, Thailand – Assembly & Test
ISO 9002 Registered (1997)
ISO/TS 16949 Registration (2003)
Recertification (2006)
ISO 14001 (2004)
AEC-Q100 Device Qualification Plan*
Test Name Conditions
ELFR 150ºC for 24 hours; Electrical test pre- and post-stress at +25ºC and +125ºC.
HTOL/DLT 150ºC for 408 hours; Electrical test pre- and post-stress at -40, +25 and +125ºC.
Readouts at 0, 96 and 408 hours.
EDR Endurance Cycling Specified erase/write cycles at +85ºC; Electrical test pre- and post-stress at +25ºC and 125ºC.
EDR High-Temp Bake/
Retention Bake
175ºC for 504 hours; Electrical test pre- and post-stress at +25ºC and +125ºC.
Readouts at 0, 96 and 504 hours.
EDR HTOL/DLT 150ºC for 408 hours; Electrical test pre- and post-stress at -40, +25, and +125ºC.
Readouts at 0, 96 and 408 hours.
ESD - HBM Electrical test pre- and post-stress at +25ºC and +125ºC. Test at each voltage: 500V, 1 KV, 2 KV, 4 KV.
ESD - MM Electrical test pre- and post-stress at +25ºC and +125ºC. Test at each voltage: 100V, 200V, 300V, 400V.
Latch-Up (Overvoltage) Test to ±14V and ±200 mA at +25ºC and ±14V and ±100 mA at +125ºC.
Electrical test pre- and post-stress at +25ºC and +125ºC.
*Additional package level qualification is performed per AEC-Q100 recommendation.
LOW-POWER ANALOG SOLUTIONS FOR AUTOMOTIVE APPLICATIONS
Microchip Analog Solutions Cover a Broad Range of Products and Applications in Automotive Systems
Safety/Security
ABS Controller
Airbag Crash Sensor Controller
Airbag Host Controller
LED Lighting
Lighting Controller
Parking Assist Controls
Steering Angle Sensor Controller
Tire Pressure Monitoring
Comfort/Convenience
Air Flow Controls
Battery Monitoring Controls
Compass Directional Controller
Door Locks/Mirror Controller
Passive Keyless Entry
Remote Keyless Entry/Immobilizer
Seat Positioning Controller
Window Lift Controller
Wiper Controller
Driver Information/
Mobile Multimedia
CD Changer Controls
GPS Receiver Controls
Heads-Up Display Controls
MP3 Player Controls
Radio Controls
Rear Seat Entertainment Controls
Steering Wheel Controls
Powertrain
Adaptive Cruise Controls
Electric Parking Brake Controls
Electronic Power Steering Controls
Electronic Stability Controls
Engine Control Module Co-Processor
Fuel Pump Controls
Gearbox Controls
Glow Plug Controls
Calendar Year
2002 2003 2004
New
Process
Failure Rate in FITs
Failure Rate: +55C, 60% Confidence Level, Assuming 0.7 eV
0
2
4
6
8
10
FIT Rate
2005
2002-2005 Analog Products FIT Rate Dynamic Life Test @ +150°C
Stress Test Qualification
Microchip has experience with the automotive industry’s
quality requirements. Our automotive customers may
request incremental device qualification testing such as the
AEC-Q100, shown below.