Datasheet

©2011 Silicon Storage Technology, Inc. DS25086A 11/11
32
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 15:Output Timing Parameters (LPC Mode)
Figure 16:Input Timing Parameters (LPC Mode)
Table 22:Interface Measurement Condition Parameters (LPC Mode)
Symbol Value Units
V
TH
1
1. The input test environment is done with 0.1 V
DD
of overdrive over V
IH
and V
IL
. Timing parameters must be met with no
more overdrive than this. V
MAX
specified the maximum peak-to-peak waveform allowed for measuring input timing. Pro-
duction testing may use different voltage values, but must correlate results back to these parameters
0.6 V
DD
V
V
TL
1
0.2 V
DD
V
V
TEST
0.4 V
DD
V
V
MAX
1
0.4 V
DD
V
Input Signal Edge Rate 1 V/ns
T22.0 25026
T
VAL
T
OFF
T
ON
1235 F14.0
LCLK
LAD [3:0]
(Valid Output Data)
LAD [3:0]
(Float Output Data)
V
TEST
V
TL
V
TH
T
SU
T
DH
Inputs
Valid
1235 F15.0
LCLK
LAD [3:0]
(Valid Input Data)
V
TEST
V
TL
V
MAX
V
TH