Datasheet

©2011 Silicon Storage Technology, Inc. DS25086A 11/11
29
8 Mbit LPC Flash
SST49LF080A
Data Sheet
A
Microchip Technology Company
Figure 13:LCLK Waveform (LPC Mode)
Table 16:Pin Capacitance
(V
DD
=3.3V, Ta=25 °C, f=1 Mhz, other pins open)
Parameter Description Test Condition Maximum
C
I/O
1
I/O Pin Capacitance V
I/O
=0V 12 pF
C
IN
1
Input Capacitance V
IN
=0V 12 pF
T16.0 25026
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Table 17:Reliability Characteristics
Symbol Parameter
Minimum
Specification Units Test Method
N
END
1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Endurance 10,000 Cycles JEDEC Standard A117
T
DR
1
Data Retention 100 Years JEDEC Standard A103
I
LTH
1
Latch Up 100 + I
DD
mA JEDEC Standard 78
T17.0 25026
Table 18:Clock Timing Parameters (LPC Mode)
Symbol Parameter Min Max Units
T
CYC
LCLK Cycle Time 30 ns
T
HIGH
LCLK High Time 11 ns
T
LOW
LCLK Low Time 11 ns
- LCLK Slew Rate (peak-to-peak) 1 4 V/ns
- RST# or INIT# Slew Rate 50 mV/ns
T18.0 25026
1235 F12.0
0.4 V
DD
p-to-p
(minimum)
T
cyc
T
high
T
low
0.4 V
DD
0.3 V
DD
0.6 V
DD
0.2 V
DD
0.5 V
DD