Datasheet

©2011 Silicon Storage Technology, Inc. DS25085A 10/11
28
8 Mbit Firmware Hub
SST49LF008A
Data Sheet
A
Microchip Technology Company
Figure 11:Input Timing Parameters
Table 20:Interface Measurement Condition Parameters
Symbol Value Units
V
TH
1
1. The input test environment is done with 0.1 V
DD
of overdrive over V
IH
and V
IL
. Timing parameters must be met
with no more overdrive than this.
V
MAX
specified the maximum peak-to-peak waveform allowed for measuring input timing. Production testing may
use different voltage values, but must correlate results back to these parameters.
0.6 V
DD
V
V
TL
1
0.2 V
DD
V
V
TEST
0.4 V
DD
V
V
MAX
1
0.4 V
DD
V
Input Signal Edge Rate 1 V/ns
T20.3 25085
T
SU
T
DH
Inputs
Valid
1161 F14.0
CLK
FWH [3:0]
(Valid Input Data)
V
TEST
V
TL
V
MAX
V
TH