Datasheet

©2011 Silicon Storage Technology, Inc. DS25085A 10/11
24
8 Mbit Firmware Hub
SST49LF008A
Data Sheet
A
Microchip Technology Company
Table 13:Recommended System Power-up Timings
Symbol Parameter Minimum Units
T
PU-READ
1
Power-up to Read Operation 100 µs
T
PU-WRITE
1
Power-up to Write Operation 100 µs
T13.2 25085
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter
Table 14:Pin Impedance (V
DD
=3.3V, T
A
=25 °C, f=1 Mhz, other pins open)
Parameter Description Test Condition Maximum
C
I/O
1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
I/O Pin Capacitance V
I/O
=0V 12pF
C
IN
1
Input Capacitance V
IN
=0V 12pF
L
PIN
2
2. Refer to PCI spec.
Pin Inductance 20 nH
T14.4 25085
Table 15:Reliability Characteristics
Symbol Parameter Minimum Specification Units Test Method
N
END
1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Endurance 10,000 Cycles JEDEC Standard A117
T
DR
1
Data Retention 100 Years JEDEC Standard A103
I
LTH
1
Latch Up 100 + I
DD
mA JEDEC Standard 78
T15.3 25085
Table 16:Clock Timing Parameters
Symbol Parameter Min Max Units
T
CYC
CLK Cycle Time 30 ns
T
HIGH
CLK High Time 11 ns
T
LOW
CLK Low Time 11 ns
- CLK Slew Rate (peak-to-peak) 1 4 V/ns
- RST# or INIT# Slew Rate 50 mV/ns
T16.1 25085