Datasheet

PIC16(L)F720/721
DS40001430E-page 190 2010-2013 Microchip Technology Inc.
23.4 DC Characteristics: PIC16(L)F720/721-I/E
DC CHARACTERISTICS
Standard Operating Conditions (unless otherwise stated)
Operating temperature -40°C TA +85°C for industrial
-40°C T
A +125°C for extended
Param.
No.
Sym. Characteristic Min. Typ† Max. Units Conditions
V
IL Input Low Voltage
I/O PORT:
D030 with TTL buffer 0.8 V 4.5V V
DD 5.5V
D030A 0.15 V
DD V1.8V VDD 4.5V
D031 with Schmitt Trigger buffer 0.2 V
DD V2.0V VDD 5.5V
with I
2
C™ levels 0.3 VDD V
V
IH Input High Voltage
I/O ports:
D040 with TTL buffer 2.0 V 4.5V V
DD 5.5V
D040A 0.25 V
DD +
0.8
——V1.8V VDD 4.5V
D041 with Schmitt Trigger buffer 0.8 V
DD ——V2.0V VDD 5.5V
with I
2
C™ levels 0.7 VDD ——V
D042 MCLR
0.8 VDD ——V
I
IL Input Leakage Current
(1)
D060 I/O ports ± 5
± 5
± 125
± 1000
nA
nA
VSS VPIN VDD, Pin at high-
impedance, 85°C
125°C
D061 MCLR
(2)
± 50 ± 200 nA VSS VPIN VDD, 85°C
I
PUR PORTB Weak Pull-up Current
D070* 25
25
100
140
200
300 A
V
DD = 3.3V, VPIN = VSS
VDD = 5.0V, VPIN = VSS
VOL Output Low Voltage
D080 I/O ports
——0.6V
I
OL = 8mA, VDD = 5V
I
OL = 6mA, VDD = 3.3V
I
OL = 1.8mA, VDD = 1.8V
V
OH Output High Voltage
D090 I/O ports
V
DD - 0.7 V
I
OH = 3.5mA, VDD = 5V
I
OH = 3mA, VDD = 3.3V
I
OH = 1mA, VDD = 1.8V
C
IO Capacitive Loading Specs on Output Pins
D101A* All I/O pins 50 pF
E
P Program Flash Memory
D130 Cell Endurance 1k 10k E/W Temperature during programming:
10°C T
A 40°C
D131 V
PR VDD for Read VMIN ——V
V
IHH Voltage on MCLR/VPP during
Erase/Program
8.0 9.0 V
Temperature during programming:
10°C TA 40°C
D132 V
PEW VDD for Write or Row Erase 1.8
1.8
5.5
3.6
V
V
PIC16F720/721
PIC16LF720/721
I
PPPGM* Current on MCLR/VPP during
Erase/Write
—1.0mA
Temperature during programming:
10°C T
A 40°C
I
DDPGM* Current on VDD during Erase/
Write
—5.0
—mA
Temperature during programming:
10°C T
A 40°C
* These parameters are characterized but not tested.
Data in “Typ” column is at 3.0V, 25°C unless otherwise stated. These parameters are for design guidance only and are
not tested.
Note 1: Negative current is defined as current sourced by the pin.
2: The leakage current on the MCLR
pin is strongly dependent on the applied voltage level. The specified levels represent
normal operating conditions. Higher leakage current may be measured at different input voltages.