Datasheet

© 2007 Microchip Technology Inc. DS41250F-page 261
PIC16F913/914/916/917/946
19.5 DC Characteristics: PIC16F913/914/916/917/946-I (Industrial)
PIC16F913/914/916/917/946-E (Extended)
DC CHARACTERISTICS
Standard Operating Conditions (unless otherwise stated)
Operating temperature -40°C ≤ TA ≤ +85°C for industrial
-40°C ≤ T
A ≤ +125°C for extended
Param
No.
Sym. Characteristic Min. Typ† Max. Units Conditions
VIL Input Low Voltage
I/O Port:
D030 with TTL buffer Vss — 0.8 V 4.5V ≤ V
DD ≤ 5.5V
D030A Vss — 0.15 V
DD V2.0V ≤ VDD ≤ 4.5V
D031 with Schmitt Trigger buffer Vss — 0.2 V
DD V2.0V ≤ VDD ≤ 5.5V
D032 MCLR
, OSC1 (RC mode)
(1)
VSS —0.2 VDD V
D033 OSC1 (XT mode) V
SS —0.3V
D033A OSC1 (HS mode) V
SS —0.3 VDD V
V
IH Input High Voltage
I/O ports: —
D040 with TTL buffer 2.0 — V
DD V4.5V ≤ VDD ≤ 5.5V
D040A 0.25 V
DD + 0.8 — VDD V2.0V ≤ VDD ≤ 4.5V
D041 with Schmitt Trigger buffer 0.8 V
DD —VDD V2.0V ≤ VDD ≤ 5.5V
D042 MCLR
0.8 VDD —VDD V
D043 OSC1 (XT mode) 1.6 — V
DD V
D043A OSC1 (HS mode) 0.7 V
DD —VDD V
D043B OSC1 (RC mode) 0.9 V
DD —VDD V (Note 1)
I
IL Input Leakage Current
(2)
D060 I/O ports — ± 0.1 ± 1 μAVSS ≤ VPIN ≤ VDD,
Pin at high-impedance
D061 MCLR
(3)
— ± 0.1 ± 5 μAVSS ≤ VPIN ≤ VDD
D063 OSC1 — ± 0.1 ± 5 μAVSS ≤ VPIN ≤ VDD, XT, HS and
LP oscillator configuration
D070* I
PUR PORTB Weak Pull-up Current 50 250 400 μAVDD = 5.0V, VPIN = VSS
VOL Output Low Voltage
(5)
D080 I/O ports — — 0.6 V IOL = 8.5 mA, VDD = 4.5V (Ind.)
V
OH Output High Voltage
(5)
D090 I/O ports VDD – 0.7 — — V IOH = -3.0 mA, VDD = 4.5V (Ind.)
* These parameters are characterized but not tested.
† Data in “Typ” column is at 5.0V, 25°C unless otherwise stated. These parameters are for design guidance only and are
not tested.
Note 1: In RC oscillator configuration, the OSC1/CLKIN pin is a Schmitt Trigger input. It is not recommended to use an external
clock in RC mode.
2: Negative current is defined as current sourced by the pin.
3: The leakage current on the MCLR
pin is strongly dependent on the applied voltage level. The specified levels represent
normal operating conditions. Higher leakage current may be measured at different input voltages.
4: See Section 13.0 “Data EEPROM and Flash Program Memory Control” for additional information.
5: Including OSC2 in CLKOUT mode.