Datasheet

 2012 Microchip Technology Inc. DS41663A-page 13
MTCH6301 PROJECTED CAPACITIVE TOUCH CONTROLLER
FIGURE 5-3: WRITE REGISTER COMMAND
FIGURE 5-4: READ REGISTER COMMAND
5.6.2 MANUFACTURING TEST
The manufacturing test ensures electrical functionality
of the sensor. This test performs the following checks
on all mapped sensor pins: short to VDD, Short to GND,
and pin-to-pin short.
If an I/O error is reported, bits for the pins in question
will be set in the “TX Short Status” and “RX Short Sta-
tus” registers.
Please note that:
1. The RX7/RX8 pins will always report an error.
2. If the sensor has more than 16 TX channels,
then channels 17 and 18 will never report an
error.
FIGURE 5-5: MANUFACTURING TEST
0x55 0x04 0x15 [D0] [D1] [D2] 0x55 0x02 0x00 0x15
Master Command Controller Response
D0 = Index Location
D1 = Offset Location
D2 = Value to Write to Specified Register
0x55 0x03 0x16 [D0] [D1] 0x55 0x03 0x00 0x16 [D2]
Master Command Controller Response
D0 = Index Location
D1 = Offset Location
D2 = Read Value at Specified Register
0x55 0x01 0x1A 0x55 0x03 0x00 0x1A [D0]
Master Command
Controller Response
D0 = Result; 0 = success, 1 = I/O error