Datasheet

Table Of Contents
© 2008 Microchip Technology Inc. DS21810F-page 5
MCP6271/1R/2/3/4/5
1.1 Test Circuits
The test circuits used for the DC and AC tests are
shown in Figure 1-2 and Figure 1-3. The bypass
capacitors are laid out according to the rules discussed
in Section 4.7 “Supply Bypass”.
FIGURE 1-2: AC and DC Test Circuit for
Most Non-Inverting Gain Conditions.
FIGURE 1-3: AC and DC Test Circuit for
Most Inverting Gain Conditions.
V
DD
MCP627X
R
G
R
F
R
N
V
OUT
V
IN
V
DD
/2
F
C
L
R
L
V
L
0.1 µF
V
DD
MCP627X
R
G
R
F
R
N
V
OUT
V
DD
/2
V
IN
F
C
L
R
L
V
L
0.1 µF