Datasheet

Table Of Contents
© 2008 Microchip Technology Inc. DS21613C-page 5
MCP616/7/8/9
TEMPERATURE CHARACTERISTICS
1.1 Test Circuits
The test circuits used for the DC and AC tests are
shown in Figure 1-2 and Figure 1-3. The bypass
capacitors are laid out according to the rules discussed
in Section 4.6 “Supply Bypass”.
FIGURE 1-2: AC and DC Test Circuit for
Most Non-Inverting Gain Conditions.
FIGURE 1-3: AC and DC Test Circuit for
Most Inverting Gain Conditions.
Electrical Specifications: Unless otherwise indicated, V
DD
= +2.3V to +5.5V and V
SS
=GND.
Parameters Sym Min Typ Max Units Conditions
Temperature Ranges
Specified Temperature Range T
A
-40 +85 °C
Operating Temperature Range T
A
-40 +125 °C Note 1
Storage Temperature Range T
A
-65 +150 °C
Thermal Package Resistances
Thermal Resistance, 8L-MSOP θ
JA
—211 °C/W
Thermal Resistance, 8L-PDIP θ
JA
89.3 °C/W
Thermal Resistance, 8L-SOIC θ
JA
149.5 °C/W
Thermal Resistance, 14L-PDIP θ
JA
—70 °C/W
Thermal Resistance, 14L-SOIC θ
JA
95.3 °C/W
Thermal Resistance, 14L-TSSOP θ
JA
100 °C/W
Note 1: The MCP616/7/8/9 operate over this extended temperature range, but with reduced performance. In any case, the
Junction Temperature (T
J
) must not exceed the Absolute Maximum specification of +150°C.
V
DD
MCP61X
R
G
R
F
R
N
V
OUT
V
IN
V
DD
/2
F
C
L
R
L
V
L
0.1 µF
V
DD
MCP61X
R
G
R
F
R
N
V
OUT
V
DD
/2
V
IN
F
C
L
R
L
V
L
0.1 µF