Datasheet

2010 Microchip Technology Inc. DS22244B-page 25
MCP4801/4811/4821
6.0 TYPICAL APPLICATIONS
The MCP4801/4811/4821 family of devices are general
purpose, single channel voltage output DACs for
various applications where a precision operation with
low-power and internal voltage reference is required.
Applications generally suited for the devices are:
Set Point or Offset Trimming
Sensor Calibration
Precision Selectable Voltage Reference
Portable Instrumentation (Battery-Powered)
Calibration of Optical Communication Devices
6.1 Digital Interface
The MCP4801/4811/4821 devices utilize a 3-wire
synchronous serial protocol to transfer the DAC’s setup
and input codes from the digital devices. The serial
protocol can be interfaced to SPI or Microwire
peripherals which are common on many microcon-
troller units (MCUs), including Microchip’s PIC
®
MCUs
and dsPIC
®
DSCs.
In addition to the three serial connections (CS
, SCK
and SDI), the LDAC
signal synchronizes the DAC
output with LDAC
pin event. By bringing the LDAC pin
down “low”, the DAC input codes and settings in the
DAC input register are latched into the output register,
and the DAC analog output is updated. Figure 6-1
shows an example of the pin connections. Note that the
LDAC
pin can be tied low (V
SS
) to reduce the required
connections from 4 to 3 I/O pins. In this case, the DAC
output can be immediately updated when a valid
16 clock transmission has been received and the CS
pin has been raised.
6.2 Power Supply Considerations
The typical application will require a bypass capacitor
to filter out noise in the power supply traces. The noise
can be induced onto the power supply’s traces from
various events such as digital switching or as a result
of changes on the DAC’s output. The bypass capacitor
helps minimize the effect of these noise sources.
Figure 6-1 illustrates an appropriate bypass strategy. In
this example, two bypass capacitors are used in paral-
lel: (a) 0.1 µF (ceramic) and (b)10 µF (tantalum). These
capacitors should be placed as close to the device
power pin (V
DD
) as possible (within 4 mm).
The power source supplying these devices should be
as clean as possible. If the application circuit has
separate digital and analog power supplies, V
DD
and
V
SS
of the device should reside on the analog plane.
6.3 Output Noise Considerations
The voltage noise density (in µV/Hz) is illustrated in
Figure 2-13. This noise appears at V
OUT
, and is
primarily a result of the internal reference voltage.
Its 1/f corner (f
CORNER
) is approximately 400 Hz.
Figure 2-14 illustrates the voltage noise (in mV
RMS
or
mV
P-P
). A small bypass capacitor on V
OUT
is an
effective method to produce a single-pole Low-Pass
Filter (LPF) that will reduce this noise. For instance, a
bypass capacitor sized to produce a 1 kHz LPF would
result in an E
NREF
of about 100 µV
RMS
. This would be
necessary when trying to achieve the low DNL error
performance (at G = 1x) that the MCP4801/4811/4821
devices are capable of. The tested range for stability
is .001 µF through 4.7 µF.
FIGURE 6-1: Typical Connection
Diagram.
6.4 Layout Considerations
Inductively-coupled AC transients and digital switching
noises can degrade the output signal integrity, and
potentially reduce the device performance. Careful
board layout will minimize these effects and increase
the Signal-to-Noise Ratio (SNR). Bench testing has
shown that a multi-layer board utilizing a
low-inductance ground plane, isolated inputs and
isolated outputs with proper decoupling, is critical for
the best performance. Particularly harsh environments
may require shielding of critical signals.
Breadboards and wire-wrapped boards are not
recommended if low noise is desired.
V
DD
V
DD
V
DD
AV
SS
AV
SS
V
SS
V
OUT
PIC
®
Microcontroller
V
OUT
SDI
SDI
CS
SDO
SCK
LDAC
CS
0
F
F
MCP48x1
MCP48x1
C1 = 10 µF
C2 = 0.1 µF
C1
C2
C2
C1
C1
C2