Datasheet

MCP3911
DS22286A-page 6 © 2012 Microchip Technology Inc.
1.2 SERIAL INTERFACE CHARACTERISTICS
TABLE 1-2: SERIAL DC CHARACTERISTICS TABLE
Electrical Specifications: Unless otherwise indicated, all parameters apply at DV
DD
= 2.7 to 3.6V, T
A
= -40°C to
+125°C, C
LOAD
= 30pF, applies to all digital I/O.
Sym Characteristics Min Typ Max Units Test Conditions
V
IH High-level Input voltage 0.7 DV
DD
— V Schmitt Triggered
VIL Low-level Input voltage — 0.3 DV
DD
V Schmitt Triggered
I
LI Input leakage current — — ±1 µA CS = DV
DD
, VIN = DGND TO
DV
DD
ILO Output leakage current — — ±1 µA CS = DV
DD
, VOUT = DGND OR
DV
DD
VHYS Hysteresis of Schmitt Trig-
ger Inputs
—200 mV(Note 2), DV
DD
= 3.3V only
V
OL Low-level output
voltage
——0.4VIOL = +2.1mA, DV
DD
= 3.3V
V
OH High-level output
voltage
DV
DD
-0.5 — — V IOH = -2.1mA, DV
DD
= 3.3V
C
INT Internal capacitance
(all inputs and
outputs)
——7 pFTA = 25°C, SCK = 1.0 MHz,
DV
DD
=3.3V (Note 1)
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is established by characterization and not production tested.
TABLE 1-3: SERIAL AC CHARACTERISTICS TABLE
Electrical Specifications: Unless otherwise indicated, all parameters apply at DV
DD
= 2.7 to 3.6V, T
A
= -40°C to
+125°C, GAIN = 1, C
LOAD
= 30pF.
Sym Characteristics Min Typ Max Units Test Conditions
f
SCK
Serial Clock frequency — — 20 MHz
t
CSS
CS setup time 25 — — ns
t
CSH
CS hold time 50 — — ns
t
CSD
CS disable time 50 — — ns
t
su
Data setup time 5 — — ns
t
HD
Data hold time 10 — — ns
t
HI
Serial Clock high time 20 — — ns
t
LO
Serial Clock low time 20 — — ns
t
CLD
Serial Clock delay time 50 — — ns
t
CLE
Serial Clock enable time 50 — — ns
t
DO
Output valid from SCK low — — 25 ns
t
DOMDAT
Modulator output valid from
AMCLK high
——1/(2*AMCLK) s
t
HO
Output hold time 0 — — ns (Note 1)
t
DIS
Output disable time — — 25 ns (Note 1)
t
MCLR
Reset Pulse Width (RESET)100 — — ns
t
DODR
Data Transfer Time to DR
(Data Ready
)
—25 ns(Note 2)
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is established by characterization and not production tested.